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current-us-classification:250/559.07
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Imaging optical unit, inspection method for the same, and image reading apparatus
US20090279095
-
Nov 12, 2009
Apparatus discriminating type of recording medium and method of discriminating type of recording medium
US7614716
-
Nov 10, 2009
Fabric wrinkle evaluation
US7601978
-
Oct 13, 2009
Method for sensing a marking on a running web of material
US7560718
-
Jul 14, 2009
Pattern defect inspection method and apparatus thereof
US7547884
-
Jun 16, 2009
Devices and methods for targeting printing plates and measuring dot coverage thereon
US7538334
-
May 26, 2009
Apparatus and method for detecting overlapping mail items
US20090121163
-
May 14, 2009
On-line thickness gauge and method for measuring the thickness of a moving glass substrate
US7516628
-
Apr 14, 2009
System and method for conducting adaptive fourier filtering to detect defects in dense logic areas of an inspection surface
US7505619
-
Mar 17, 2009
Apparatus for identifying the condition of a conveyor belt
US7427767
-
Sep 23, 2008
Device and method for identifying recording medium and image forming apparatus
US20080169438
-
Jul 17, 2008
Wafer center finding with contact image sensors
US20080135788
-
Jun 12, 2008
Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device manufacturing method
US20080128644
-
Jun 05, 2008
Dynamic focusing method and apparatus
US7321108
-
Jan 22, 2008
Imaging method based on calculation of topological energy
US20070215823
-
Sep 20, 2007
Dynamic focusing method and apparatus
US7196300
-
Mar 27, 2007
Organic photoelectric conversion element and image element
US20070063156
-
Mar 22, 2007
Object data input apparatus and object reconstruction apparatus
US7189984
-
Mar 13, 2007
Resolution enhancement for macro wafer inspection
US7176433
-
Feb 13, 2007
Apparatus and method to inspect display panels
US7166856
-
Jan 23, 2007
Method and apparatus to discriminate the class of medium to form image
US7145160
-
Dec 05, 2006
Method and apparatus for inspecting samples, and method for manufacturing devices using method and apparatus for inspecting samples
US20050104017
-
May 19, 2005
Method and apparatus to discriminate the class of medium to form image
US20050029474
-
Feb 10, 2005
Identification of recording media
US6838687
-
Jan 04, 2005
Method and device for measuring wear on internal barrel surfaces
US6815701
-
Nov 09, 2004
Optical object identification apparatus, and printing apparatus and object classification apparatus using same
US20040129901
-
Jul 08, 2004
Spectroscopic image input system
US6614533
-
Sep 02, 2003
On-line measuring system for measuring substrate thickness and the method thereof
US6590221
-
Jul 08, 2003
Method and apparatus for polarization filtered x-ray film scanning recording
US6509575
-
Jan 21, 2003
Apparatus and methods for capturing defect data
US6437358
-
Aug 20, 2002
Variable printing system and method with optical feedback
US6335978
-
Jan 01, 2002
Identification of recording medium in a printer
US6291829
-
Sep 18, 2001
Web inspection system for analysis of moving webs
US6259109
-
Jul 10, 2001
Method for inspecting spinning bobbins and system for implementing such method
US6216432
-
Apr 17, 2001
Microprobe chip for detecting evanescent waves probe provided with the microprobe chip and evanescent wave detector, nearfield scanning optical microscope, and information regenerator provided with the microprobe chip
US6211532
-
Apr 03, 2001
Device for use in the optical investigation of surfaces
US6121599
-
Sep 19, 2000
Method of illuminating a digital representation of an image
US6091834
-
Jul 18, 2000
Non-contact method and apparatus to obtain a timing signal from internal integrated circuit nodes
US6075234
-
Jun 13, 2000
Dynamic reflective density measuring and control system for a web printing press
US6058201
-
May 02, 2000
Measuring method and apparatus of gloss irregularity and printing unevenness
US5974160
-
Oct 26, 1999
Automatic plate scanner
US5696588
-
Dec 09, 1997
Thermal sensors arrays useful for motion tracking by thermal gradient detection
US5691921
-
Nov 25, 1997
Non-distorting video camera for use with a system for controlling growth of a silicon crystal
US5656078
-
Aug 12, 1997
Composite material laser flaw detection
US5562788
-
Oct 08, 1996
Coating density analyzer and method using image processing
US5533139
-
Jul 02, 1996
Radiation image read-out method and apparatus
US5530260
-
Jun 25, 1996
Light-induced voltage alteration for integrated circuit analysis
US5430305
-
Jul 04, 1995
Method and apparatus for determining the image clarity of a surface
US5359668
-
Oct 25, 1994
Shell egg culling system
US5277320
-
Jan 11, 1994
Method and system for broad area field inspection of a moving web, particularly a printed web
US5256883
-
Oct 26, 1993
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Method and apparatus (18)
Image (11)
Inspection method (5)
Recording (5)
System and method (5)
Device AND method (5)
Surface (4)
Thickness - substrate (2)
Input (2)
Data (2)
Plate (2)
Density (2)
Wafer (2)
Sensors (2)
Processing (2)
Dynamic-focusing-apparatus - dynamic focusing method and apparatus (2)
Material (2)
Filtered (2)
Detection (2)
Analysis (2)
Apparatus and object (2)
Apparatus inspecting (2)
Integrated circuit (2)