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Display device and electronic apparatus having the display device

US20090284278 - Nov 19, 2009

Test circuit for a semiconductor integrated circuit

US7619433 - Nov 17, 2009

Tandem handler system and method for reduced index time

US7619432 - Nov 17, 2009

High sensitivity magnetic built-in current sensor

US7619431 - Nov 17, 2009

Self-test circuit for high-definition multimedia interface integrated circuits

US7617064 - Nov 10, 2009

Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device

US7616020 - Nov 10, 2009

System for isolating a short-circuited integrated circuit (ic) from other ics on a semiconductor wafer

US20090273360 - Nov 05, 2009

Built-in test feature to facilitate system level stress testing of a high-speed serial link that uses a forwarding clock

US7613237 - Nov 03, 2009

Systems and methods for defect testing of externally accessible integrated circuit interconnects

US7612574 - Nov 03, 2009

Probe sensing pads and methods of detecting positions of probe needles relative to probe sensing pads

US7612573 - Nov 03, 2009

Method of phase shifting bits in a digital signal pattern

US7609758 - Oct 27, 2009

Probeless dc testing of cmos i/o circuits

US7609079 - Oct 27, 2009

Method of measuring characteristic impedance of electrostatic discharge protecting circuit and apparatus for realizing the same

US7609076 - Oct 27, 2009

Intra-chip power and test signal generation for use with test structures on wafers

US7605597 - Oct 20, 2009

Voltage generating apparatus, current generating apparatus, and test apparatus

US7605584 - Oct 20, 2009

Driving circuit for display device, and test circuit and test method for driving circuits

US20090256493 - Oct 15, 2009

Electromigration tester for high capacity and high current

US7602205 - Oct 13, 2009

Process and temperature insensitive flicker noise monitor circuit

US20090251164 - Oct 08, 2009

Semiconductor integrated circuit having a degradation notice signal generation circuit

US7598761 - Oct 06, 2009

Systems and methods for adjusting threshold voltage

US7598731 - Oct 06, 2009

Method of processing and printing autofocussed images

US20090244294 - Oct 01, 2009

Image pickup system and method for maintaining the same

US20090244273 - Oct 01, 2009

Methods and apparatus for imaging using a light guide bundle and a spatial light modulator

US20090244272 - Oct 01, 2009

Electronic endoscope apparatus

US20090244271 - Oct 01, 2009

Methods and apparatus for inline variability measurement of integrated circuit components

US7595654 - Sep 29, 2009

Virtual white lines for delimiting planned excavation sites

US20090237408 - Sep 24, 2009

Method and apparatus for test and characterization of semiconductor components

US7592824 - Sep 22, 2009

Semiconductor device and electronics device

US7592797 - Sep 22, 2009

Semiconductor device

US20090230987 - Sep 17, 2009

Semiconductor integrated circuit, fuse circuit for semiconductor integrated circuit and control method of the same

US20090230986 - Sep 17, 2009

On-wafer ac stress test circuit

US7589551 - Sep 15, 2009

De-embedding method for on-wafer devices

US20090224791 - Sep 10, 2009

Image display device and testing method of the same

US20090219048 - Sep 03, 2009

Isolation circuit

US20090212810 - Aug 27, 2009

Device test and debug using power and ground terminals

US20090212809 - Aug 27, 2009

Electro-optical device and electronic apparatus

US20090212808 - Aug 27, 2009

Semiconductor device and liquid crystal panel driver device

US7580020 - Aug 25, 2009

Self-test method for interface circuit

US20090206867 - Aug 20, 2009

Electrical test structure and method for characterization of deep trench sidewall reliability

US20090206865 - Aug 20, 2009

On-chip servo loop integrated circuit system test circuitry and method

US20090206864 - Aug 20, 2009

System and method for testing a plurality of circuits

US20090206863 - Aug 20, 2009

Security-sensitive semiconductor product, particularly a smart-card chip

US7577926 - Aug 18, 2009

Semiconductor devices and methods of testing the same

US7576554 - Aug 18, 2009

I/o port tester

US7574318 - Aug 11, 2009

Phase rotator control test scheme

US7573937 - Aug 11, 2009

Multiple point gate oxide integrity test method and system for the manufacture of semiconductor integrated circuits

US7573285 - Aug 11, 2009

Wafer scale testing using a 2 signal jtag interface

US7571365 - Aug 04, 2009

Semiconductor wafer having a multitude of sensor elements and method for measuring sensor elements on a semiconductor wafer

US20090189629 - Jul 30, 2009

Reworkable bonding pad layout and debug method thereof

US20090189628 - Jul 30, 2009

Method for evaluating semiconductor device

US7567882 - Jul 28, 2009

items / page

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Circuits (17)

Semiconductor (14)

Method of testing (10)

System and method (7)

Method and apparatus (4)

Image (3)

Pad (3)

Tester (3)

Signal generation (2)

Device and electronic apparatus (2)

Testing structure (2)

Stress test (2)