Become A Member
Login
Help
Choose Language
:
English - English
Español - Spanish
日本語 - Japanese
中文 (简体) - Chinese (Simplified)
中文 (繁體) - Chinese (Traditional)
한국어 - Korean
Search
Inventors
Companies
Attorneys
Tools
Community
Exchange
You searched
:
current-us-classification:356/369
{
Showing
:
1-50
of
1046
}
|
Modify Search
|
Save Search
As
:
items / page
10
50
100
250
500
1
2
3
4
5
>
»
Filter Results By
:
US Patents
US Patent Application
US Design Patents
European Patents
Optimized grating based biosensor and substrate combination
US7620276
-
Nov 17, 2009
Apparatus and method for obtaining sample information by detecting electromagnetic wave
US7619736
-
Nov 17, 2009
Library accuracy enhancment and evaluation
US7617075
-
Nov 10, 2009
Spectroscopic ellipsometer and polarimeter systems
US7616319
-
Nov 10, 2009
Apparatus and method for probing integrated circuits using laser illumination
US7616312
-
Nov 10, 2009
Advanced polarization imaging method, apparatus, and computer program product for retinal imaging, liquid crystal testing, active remote sensing, and other applications
US7612880
-
Nov 03, 2009
Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner
US7612321
-
Nov 03, 2009
Portable modular detection system
US7602307
-
Oct 13, 2009
Determining one or more profile parameters of a structure using optical metrology and a correlation between profile models and key profile shape variables
US7596422
-
Sep 29, 2009
Optically measuring substances using propagation modes of light
US7595879
-
Sep 29, 2009
Method for imaging the earth's subsurface using passive seismic sensing
US20090238040
-
Sep 24, 2009
Method of determining and/or evaluating a differential optical signal
US7589303
-
Sep 15, 2009
Spectroscopic ellipsometer
US20090225317
-
Sep 10, 2009
Optical metrology of single features
US7586623
-
Sep 08, 2009
Polarization imaging
US7586607
-
Sep 08, 2009
Method for testing a polarization state, method for manufacturing a semiconductor device, and test substrate for testing a polarization state
US7586605
-
Sep 08, 2009
Laser etched fiducials in roll-roll display
US7583834
-
Sep 01, 2009
Surface profile measuring apparatus
US7583392
-
Sep 01, 2009
Reflective optical system
US20090213377
-
Aug 27, 2009
Metrology system with spectroscopic ellipsometer and photoacoustic measurements
US20090201502
-
Aug 13, 2009
System for scatterometric measurements and applications
US20090195779
-
Aug 06, 2009
High resolution monitoring of cd variations
US7567351
-
Jul 28, 2009
Ellipsometer meeting scheimpflug condition with provision of an essentially circular electromagnetic radiation spot on a sample
US7567345
-
Jul 28, 2009
Apparatus for inspecting food
US20090185163
-
Jul 23, 2009
Reducing depolarisation
US7565037
-
Jul 21, 2009
Systems and methods for measurement of a specimen with vacuum ultraviolet light
US7564552
-
Jul 21, 2009
Optical metrology systems and methods
US20090174883
-
Jul 09, 2009
Apparatus for detecting position of substrate, ellipsometer, and film thickness measuring apparatus
US7557919
-
Jul 07, 2009
Spectral polarimetric image detection and analysis methods and apparatus
US7557918
-
Jul 07, 2009
Spatial filter means comprising an aperture with a non-unity aspect ratio in a system for investigating samples with electromagnetic radiation
US7554662
-
Jun 30, 2009
Inspection apparatus and inspection method
US20090161943
-
Jun 25, 2009
Position sensor
US7551281
-
Jun 23, 2009
Polishing end point detection method, polishing end point detection apparatus and polishing apparatus
US20090153859
-
Jun 18, 2009
Method and apparatus for observing and inspecting defects
US20090141264
-
Jun 04, 2009
Flipping stage arrangement for reduced wafer contamination cross section and improved measurement accuracy and throughput
US7542136
-
Jun 02, 2009
Lithographic and measurement techniques using the optical properties of biaxial crystals
US7541600
-
Jun 02, 2009
Beam chromatic shifting and directing means
US7535566
-
May 19, 2009
Spectroscopic ellipsometer and ellipsometry
US20090109438
-
Apr 30, 2009
System and method for active optical target detection with polarized receiver
US7525657
-
Apr 28, 2009
Ellipsometric investigation and analysis of textured samples
US20090103094
-
Apr 23, 2009
Fast sample height, aoi and poi alignment in mapping ellipsometer or the like
US20090103093
-
Apr 23, 2009
Acoustic and optical illumination technique for underwater charaterization of objects/environment
US20090103083
-
Apr 23, 2009
Temperature controlled lens
US7518725
-
Apr 14, 2009
Image acquisition, processing, and display
US7518724
-
Apr 14, 2009
Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslation
US20090091758
-
Apr 09, 2009
Surface inspection device
US20090079983
-
Mar 26, 2009
Method and apparatus for improved ellipsometric measurement of ultrathin films
US7508511
-
Mar 24, 2009
Optical measurements of properties in substances using propagation modes of light
US20090073444
-
Mar 19, 2009
Method and equipment for detecting pattern defect
US20090073443
-
Mar 19, 2009
Optical method for the characterization of laterally patterned samples in integrated circuits
US7505154
-
Mar 17, 2009
items / page
10
50
100
250
500
1
2
3
4
5
>
»
Cluster
:
10
50
100
250
500
Measurements (7)
Samples (6)
Method And apparatus (8)
Metrology (4)
Spectroscopic ellipsometer (4)
Detection (4)
Beam (3)
Substrate (3)
System and method (3)
Polarization imaging (2)
Applications (2)
Illumination (2)
Laser (2)
Profile (2)
Technique (2)
Accuracy (2)
Crystals (2)
Surface (2)
Ellipsometric (2)
Position (2)
Films (2)
Image (2)
Analysis (2)
Inspection (2)
Defect (2)
Integrated circuits (2)
Measuring apparatus (2)
Substances using propagation modes of light (2)