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Optically detected liquid depth information in a climate control unit

US20090229784 - Sep 17, 2009

Method and apparatus for layer thickness measurement

US20090222238 - Sep 03, 2009

System and method to measure parameters distribution in sheet-like objects

US7570373 - Aug 04, 2009

Device and method for measuring the thickness of a transparent sample

US7554678 - Jun 30, 2009

Method for measuring thickness of thin film, method for forming polycrystal semiconductor thin film, method for manufacturing semiconductor device, apparatus for manufacturing the same, and method for manufacturing image display device

US7542152 - Jun 02, 2009

Culture vessel and cellular thickness measurement method

US20090097016 - Apr 16, 2009

Apparatus for detecting cell gap of a liquid crystal display panel

US7511795 - Mar 31, 2009

Visual inspection apparatus for a wafer

US20080316506 - Dec 25, 2008

Resonant waveguide-grating devices and methods for using same

US20080316485 - Dec 25, 2008

Detector configurations for optical metrology

US7456964 - Nov 25, 2008

Measuring instrument, in particular for transmission measurement in vacuum system

US7443518 - Oct 28, 2008

Apparatus and method for detecting lens thickness

US7433027 - Oct 07, 2008

Method and apparatus for measuring interfacial positions, method and apparatus for measuring layer thickness, and method and apparatus for manufacturing optical discs

US7420691 - Sep 02, 2008

Method and apparatus for protecting an optical transmission measurement when sensing transparent materials

US7417749 - Aug 26, 2008

Method and apparatus for contactless optical measurement of the thickness of a hot glass body by optical dispersion

US7414740 - Aug 19, 2008

Measuring device

US7385710 - Jun 10, 2008

Apparatus and method for measuring sidewall thickness of non-round transparent containers

US7385174 - Jun 10, 2008

Near infrared light diffuser

US20080129995 - Jun 05, 2008

Spectroscopic sensor for measuring sheet properties

US7382456 - Jun 03, 2008

Dual photo-acoustic and resistivity measurement system

US7372584 - May 13, 2008

Apparatus and method for monitoring trench profiles and for spectrometrologic analysis

US7372579 - May 13, 2008

Apparatus and method for capacitive measurement of materials

US7369255 - May 06, 2008

Method and system for measuring overcoat layer thickness on a thin film disk

US7362454 - Apr 22, 2008

Method for detecting an end-point for polishing a material

US7355711 - Apr 08, 2008

Safety monitoring mechanism of a wafer fabrication platform

US7333022 - Feb 19, 2008

Method for measurement of three-dimensional objects by single-view backlit shadowgraphy

US7307740 - Dec 11, 2007

Method for biomolecular sensing and system thereof

US7292349 - Nov 06, 2007

Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement

US7282703 - Oct 16, 2007

Interferometric modulation of radiation

US7280265 - Oct 09, 2007

Device to determine the thickness of a conductive layer

US7262867 - Aug 28, 2007

Method and apparatus for measuring a characteristic of a plastic container

US7253892 - Aug 07, 2007

Method of and device for thickness measurement of thick petrochemical films on water surface

US20070177163 - Aug 02, 2007

Method and system for measuring thin films

US7251043 - Jul 31, 2007

Method and apparatus for measuring interfacial positions, method and apparatus for measuring layer thickness, and method and apparatus for manufacturing optical discs

US20070153298 - Jul 05, 2007

Method and apparatus for measuring thickness of a material

US7233401 - Jun 19, 2007

Method for measuring gap of liquid crystal cell

US7230713 - Jun 12, 2007

Apparatus and method for measuring spectral reflectance and apparatus for measuring film thickness

US7206074 - Apr 17, 2007

Detector configurations for optical metrology

US7206071 - Apr 17, 2007

Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures

US20070081167 - Apr 12, 2007

Target detecting apparatus, target detection method and target detection substrate

US7202954 - Apr 10, 2007

Thin thickness measurement method and apparatus

US7199884 - Apr 03, 2007

Method and apparatus for measurements of patterned structures

US7187456 - Mar 06, 2007

Slit confocal autofocus system

US7142315 - Nov 28, 2006

Diffraction method for measuring thickness of a workpart

US20060262327 - Nov 23, 2006

Measuring instrument, in particular for transmission measurement in vaccuum system

US20060256351 - Nov 16, 2006

Rapid-response electron-beam deposition system having a controller utilizing leading and trailing deposition indicators

US7130062 - Oct 31, 2006

Bearing with oil film thickness measuring device

US7126677 - Oct 24, 2006

Method and apparatus for measurements of patterned structures

US7123366 - Oct 17, 2006

Method for measuring cell gap variation of liquid crystal panel and apparatus thereof

US20060220670 - Oct 05, 2006

Sensor with alignment self compensation

US7071480 - Jul 04, 2006

items / page

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Thickness (17)

Method and apparatus (19)

Measurements (15)

Method for measuring (13)

Film (7)

Detector-configurations-optical-metrology - detector configurations for optical metrology (2)