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Methods of fabricating light emitting devices by selective deposition of light conversion materials based on measured emission characteristics
US20090286335
-
Nov 19, 2009
Method of manufacturing image sensor
US7618834
-
Nov 17, 2009
Method of monitoring the manufacture of interferometric modulators
US7618831
-
Nov 17, 2009
Evaluation method of semiconductor device, manufacturing method of the semiconductor device, design management system of device comprising the semiconductor device, dose amount control program for the semiconductor device, computer-readable recording medium recording the program, and dose amount control apparatus
US7615422
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Nov 10, 2009
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus
US20090272901
-
Nov 05, 2009
Apparatus and method for in-situ monitoring of wafer bonding time
US7612895
-
Nov 03, 2009
Method for fabricating a semiconductor device by considering the extinction coefficient during etching of an interlayer insulating film
US20090269864
-
Oct 29, 2009
Substrate with check mark and method of inspecting position accuracy of conductive glue dispensed on the substrate
US20090267241
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Oct 29, 2009
Method of fabricating a chip
US7608469
-
Oct 27, 2009
Apparatus and methods for determining overlay and uses of same
US7608468
-
Oct 27, 2009
Pattern verification method, method of manufacturing semiconductor device, and recording media
US20090258446
-
Oct 15, 2009
Apparatus and method for identifying proper orientation and electrical conductivity between a semiconductor device and a socket or contactor
US7601559
-
Oct 13, 2009
Etching process state judgment method and system therefor
US20090253222
-
Oct 08, 2009
Semiconductor device and manufacturing method therefor
US20090250697
-
Oct 08, 2009
Method of controlling a fabrication process using an iso-dense bias
US7598099
-
Oct 06, 2009
Monitoring the reduction in thickness as material is removed from a wafer composite and test structure for monitoring removal of material
US7598098
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Oct 06, 2009
Femto cell system selection
US20090247157
-
Oct 01, 2009
Flash memory device and program method thereof
US20090244983
-
Oct 01, 2009
Wafer level assemble chip multi-site testing solution
US7595631
-
Sep 29, 2009
Optical metrology model optimization based on goals
US7588949
-
Sep 15, 2009
Test structure for electrically verifying the depths of trench-etching in an soi wafer, and associated working methods
US7588948
-
Sep 15, 2009
Controlling system for gate formation of semiconductor devices
US7588946
-
Sep 15, 2009
Methods for discretized processing of regions of a substrate
US20090227049
-
Sep 10, 2009
Wafer-level testing of optical and optoelectronic chips
US7586608
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Sep 08, 2009
Method and apparatus for processing a wafer
US7585686
-
Sep 08, 2009
Manufacturing method for semiconductor integrated circuit device
US20090221105
-
Sep 03, 2009
Charged particle beam exposure method and charged particle beam exposure device
US7582884
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Sep 01, 2009
Method of doping impurities, and electronic element using the same
US7582492
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Sep 01, 2009
Shower head structure for processing semiconductor
US20090215205
-
Aug 27, 2009
Cof packaging structure, method of manufacturing the cof packaging structure, and method for assembling a driver ic and the cof packaging structure thereof
US20090206472
-
Aug 20, 2009
Creating a library for measuring a damaged structure formed on a wafer using optical metrology
US7576851
-
Aug 18, 2009
Methods for accurately measuring the thickness of an epitaxial layer on a silicon wafer
US20090203156
-
Aug 13, 2009
Methods for evaluating and manufacturing semiconductor wafer
US20090197359
-
Aug 06, 2009
Method for manufacturing a semiconductor device, method for detecting a semiconductor substrate and semiconductor chip package
US20090194865
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Aug 06, 2009
Method of using a wafer-thickness-dependant profile library
US7571074
-
Aug 04, 2009
Method of measuring porosity by means of ellipsometry and device for implementing one such method
US7568379
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Aug 04, 2009
Positioning apparatus, exposure apparatus, and method of manufacturing device
US20090191651
-
Jul 30, 2009
Semiconductor device manufacturing method and manufacturing line thereof
US7566665
-
Jul 28, 2009
Method for correcting a mask pattern, system for correcting a mask pattern, program, method for manufacturing a photomask and method for manufacturing a semiconductor device
US20090186429
-
Jul 23, 2009
Method for constructing module for optical critical dimension (ocd) and measureing method of module for optical critical dimension using the module
US20090186428
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Jul 23, 2009
Characterizing films using optical filter pseudo substrate
US20090186427
-
Jul 23, 2009
Method for forming bumps, semiconductor device and method for manufacturing same, substrate processing apparatus, and semiconductor manufacturing apparatus
US20090186425
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Jul 23, 2009
Cog-typed organic electroluminescent cell
US7564068
-
Jul 21, 2009
Wafer tilt detection apparatus and method
US7561258
-
Jul 14, 2009
Template for forming solder bumps, method of manufacturing the template and method of inspecting solder bumps using the template
US20090176321
-
Jul 09, 2009
Manufacturing method for semiconductor device
US7556973
-
Jul 07, 2009
Methods for calibrating a process for growing an epitaxial silicon film and methods for growing an epitaxial silicon film
US20090170223
-
Jul 02, 2009
Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, and light-emitting device and electric appliance having light-emitting element
US20090168048
-
Jul 02, 2009
Method for detecting semiconductor manufacturing conditions
US7553678
-
Jun 30, 2009
Methods, objects and apparatus employing machine readable data
US7548643
-
Jun 16, 2009
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Methods for manufacturing a semiconductor device (10)
Wafer (9)
Apparatus and method (10)
Process (7)
Chip (4)
Material (3)
Film (3)
Methods of fabricating (3)
Exposure (2)
Cell (2)
Silicon (2)
Library (2)
Element (2)
Positioning (2)
Optical metrology (2)
Evaluation method (2)
Methods of inspecting (2)
Methods for detecting (2)