A fundus examination apparatus includes an illumination optical system (20), which illuminates a fundus by fundus illumination light, an imaging optical system (21), which photographs a fundus image based on a polarization property of reflected illumination light, and a picture signal processing device, which processes a signal output from the imaging optical system; and the imaging optical system includes a phase plate array (42) that a plurality of unit constitutional plates (U1) is arranged in a matrix in a plane; each of the unit constitutional plates comprising four or more micro phase plates (44a-44d), a polarizer (43), which polarizes the reflected illumination light passing through the phase plate array (42) into a predetermined polarization direction, and an image pickup device (5a) that a plurality of constitutional units (U2) is arranged in a matrix in a plane; each of the constitutional units comprising four or more pixels (Ga-Gd).
A fundus examination apparatus includes an illumination optical system (20), which illuminates a fundus by fundus illumination light, an imaging optical system (21), which photographs a fundus image based on a polarization property of reflected illumination light, and a picture signal processing device, which processes a signal output from the imaging optical system; and the imaging optical system includes a phase plate array (42) that a plurality of unit constitutional plates (U1) is arranged in a matrix in a plane; each of the unit constitutional plates comprising four or more micro phase plates (44a-44d), a polarizer (43), which polarizes the reflected illumination light passing through the phase plate array (42) into a predetermined polarization direction, and an image pickup device (5a) that a plurality of constitutional units (U2) is arranged in a matrix in a plane; each of the constitutional units comprising four or more pixels (Ga-Gd).