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| Patent # | Description |
|---|---|
| 2018/0081009 |
WIRELESS-TYPE RF COIL AND TRANSMITTER FOR LEGACY MAGNETIC RESONANCE
IMAGING (MRI) SYSTEMS AND METHOD OF... A transmission apparatus for legacy magnetic resonance (MR) systems including one or more of a radio transmission portion having coupling to an analog RF cable... |
| 2018/0081008 |
MODULATING MAGNETIC RESONANCE IMAGING TRANSMIT FIELD IN MAGNETIC RESONANCE
FINGERPRINTING USING SINGLE LAYER... Methods and other embodiments control a member of a plurality of MRI transmit (Tx)/receive (Rx) coil array elements to operate in a resonant Tx mode or in a... |
| 2018/0081007 |
SYSTEMS AND METHODS FOR DISCONNECTING AN MRI RF COIL Various methods and systems are provided for a disconnecting a receive coil from a transmit coil of a magnetic resonance (MR) imaging apparatus during a... |
| 2018/0081006 |
SYSTEMS AND METHODS FOR DISCONNECTING AN MRI RF COIL Various methods and systems are provided for a disconnecting a receive coil from a transmit coil of a magnetic resonance (MR) system during a transmit... |
| 2018/0081005 |
SINGLE LAYER MAGNETIC RESONANCE IMAGING TRANSMIT/RECEIVE RADIO FREQUENCY
COIL A magnetic resonance imaging (MRI) radio frequency (RF) coil array configured to operate in a transmit (Tx) mode or in a receive (Rx) mode, the MRI RF coil... |
| 2018/0081004 |
RADIO FREQUENCY (RF) TRANSMIT SYSTEM FOR DIGITAL RF CURRENT SOURCE Example embodiments include a radio frequency (RF) transmit system for a digital RF current source, the system including a magnetic resonance imaging (MRI)... |
| 2018/0081003 |
MAGNETIC RESONANCE IMAGING SCANNER According to an embodiment of the present disclosure, disclosed is an apparatus for generating a radio frequency (RF) pulse in a magnetic resonance imaging... |
| 2018/0081002 |
Method for testing local magnetomechanical coupling coefficient of a
magnetic material A method for testing a local magnetomechanical coupling coefficient of a magnetic material includes defining a square of a local magnetomechanical coupling... |
| 2018/0081001 |
Magnetic Sensor, Magnetic Sensor Device, and Diagnostic Device In one embodiment, a first magnetoresistive effect element, a current supply unit and a detecting unit is provided. The first magnetoresistive effect element... |
| 2018/0081000 |
SINGLE CHIP Z-AXIS LINEAR MAGNETORESISTIVE SENSOR WITH
CALIBRATION/INITIALIZATION COIL A single chip Z-axis linear magnetoresistive sensor with a calibration/initialization coil comprises a single chip Z-axis linear magnetoresistive sensor, and a... |
| 2018/0080999 |
DETERMINING POWER ELECTRONICS FEASIBILITY WITH SINGLE TURN MAGNETIC
SIMULATION DATA Techniques for determining power electronics feasibility in a wireless power transfer system with a transmitting element and a receiving element are provided.... |
| 2018/0080998 |
POWER ESTIMATING APPARATUS, IMAGE FORMING APPARATUS, AND NON-TRANSITORY
COMPUTER READABLE MEDIUM A power estimating apparatus includes a functional unit, at least one converter, a detection unit, and an estimating unit. The functional unit uses an... |
| 2018/0080997 |
METHOD FOR TESTING BATTERY CYCLE LIFE BASED ON ENVIRONMENTAL TEMPERATURE A method for testing battery cycle life based on environmental temperature is provided. The method comprises recording the daily average temperatures of a... |
| 2018/0080996 |
DETERIORATION DETECTOR FOR NON-AQUEOUS ELECTROLYTE POWER STORAGE ELEMENT,
POWER STORAGE DEVICE, DETERIORATION... According to an embodiment of the present invention, deterioration of a non-aqueous electrolyte power storage element is detected based on a first increase... |
| 2018/0080995 |
NOTIFICATION SYSTEM AND METHOD FOR PROVIDING REMAINING RUNNING TIME OF A
BATTERY A notification method and system for providing notification regarding remaining time of a battery are disclosed. According to certain embodiments, the method... |
| 2018/0080994 |
SCHEME APPLIED INTO ELECTRONIC DEVICE AND CAPABLE OF MEASURING RESISTANCE
PARAMETER(S) ASSOCIATED WITH BATTERY CELL A method applied into an electronic device and capable of measuring at least one resistance parameter includes: launching a program/application on the... |
| 2018/0080993 |
RECHARGEABLE BATTERY REMAINING CAPACITY DETECTION CIRCUIT, ELECTRONIC
MACHINE AND VEHICLE USING THE SAME, AND... The present invention provides an improved method for detecting the state of charge (SOC) of a battery. A remaining capacity detection circuit detects the SOC... |
| 2018/0080992 |
DETERMINATION OF A BATTERY-MODEL PARAMETER A battery management unit may measure a battery voltage of a battery across a first pair of nodes of the battery management unit to produce a first battery... |
| 2018/0080991 |
METHOD AND SYSTEM FOR PREDICTING ENERGY CONSUMPTION OF A VEHICLE THROUGH
APPLICATION OF A STATISTICAL MODEL... A method for predicting energy consumption of a vehicle using a statistical model. The method includes (i) predicting a set of future input vectors for the... |
| 2018/0080990 |
BATTERY TESTING APPARATUS AND METHOD Disclosed is a battery testing apparatus, which includes a memory unit configured to store profile data of a battery; an interface unit configured to receive a... |
| 2018/0080989 |
ASSESSMENT METHOD FOR FLASHOVER FAULTS OF 220 KV OR HIGHER PORCELAIN LIVE
TANK CIRCUIT BREAKER An assessment method for flashover faults of 220 kV or higher porcelain live tank circuit breakers, including the following steps: step 1, collecting fault... |
| 2018/0080988 |
PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER
COUPLED TO SCI/SCO/PCO The disclosure describes novel methods and apparatuses for accessing test compression architectures (TCA) in a device using either a parallel or serial access... |
| 2018/0080987 |
CLOCK SELECTION CIRCUIT AND TEST CLOCK GENERATION CIRCUIT FOR LBIST AND
ATPG TEST CIRCUIT A test circuit receives LBIST and ATPG mode signals, and generates a first output as high when in ATPG or LBIST, and a second output as low when in ATPG or... |
| 2018/0080986 |
ROBUST BUILT-IN SELF TEST CIRCUITRY Embodiments are directed to a semiconductor wafer having on-wafer circuitry. The on-wafer circuitry includes functional circuitry and first drive circuitry... |
| 2018/0080985 |
PROCESSING METHOD AND ELECTRONIC APPARATUS FOR DIGITAL SIGNAL A processing method and electronic apparatus for a digital signal are provided. The method includes: detecting the quality of a first eye in an eye diagram of... |
| 2018/0080984 |
SEMICONDUCTOR DEVICE, DIAGNOSTIC TEST, AND DIAGNOSTIC TEST CIRCUIT A semiconductor device includes a system bus, a plurality of Central Processing Unit (CPU) cores each connected to the system bus, including a scan chain, and... |
| 2018/0080983 |
VISIBLE LASER CIRCUIT FAULT ISOLATION A transparent coversheet intervenes between a lens and a thinned die in a visible light fault analysis tool so that the thinned die is robust to fractures. In... |
| 2018/0080982 |
ELECTRONIC COMPONENT CARRYING DEVICE AND ELECTRONIC COMPONENT INSPECTION
DEVICE An inspection device includes: one chamber in which an IC device after an inspection can be arranged; another chamber in which the IC device after the... |
| 2018/0080981 |
ELECTRONICS TESTER WITH DOUBLE-SPIRAL THERMAL CONTROL PASSAGE IN A THERMAL
CHUCK The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a... |
| 2018/0080980 |
SYSTEM AND METHODS FOR ANALYZING AND ESTIMATING SUSCEPTIBILITY OF CIRCUITS
TO RADIATION-INDUCED... Systems and methods for semiconductor design evaluation. IC layout information of a circuit design is received, and the circuit design is decomposed into... |
| 2018/0080979 |
TESTING SYSTEM AND METHOD A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured... |
| 2018/0080978 |
TESTING SYSTEM AND METHOD A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured... |
| 2018/0080976 |
SEMICONDUCTOR DEVICE AND METHOD OF DIAGNOSING SEMICONDUCTOR DEVICE A semiconductor device includes a logic circuit, a memory circuit having a plurality of first static memory cells formed by a transistor on the semiconductor... |
| 2018/0080975 |
NON-CONTACT PROBE SIGNAL LOADING DEVICE A non-contact probe signal loading device is disclosed. The non-contact probe signal loading device includes a probe metal sheet electrically connected to a... |
| 2018/0080974 |
PERFORMANCE EVALUATION METHOD OF SUSPENDED CHANNEL PLASMA WAVE TRANSISTOR Provided is a method of evaluating a performance of a suspended channel plasma wave device (PWD) to evaluate a terahertz emission possibility of the suspended... |
| 2018/0080973 |
GATE DRIVING CIRCUIT AND METHOD FOR DETECTING SAME, ARRAY SUBSTRATE AND
DISPLAY APPARATUS The present disclosure provides a gate driving circuit, a method for detecting the gate driving circuit, an array substrate and a display apparatus. The gate... |
| 2018/0080972 |
DETECTION OF DAMPER RESISTOR DEGRADATION AND FAILURES A system and method of detecting dampener resistor degradation and failure are provided. The method includes determining a normal operating admittance value of... |
| 2018/0080971 |
MONITORING AND ALERT SYSTEM FOR INDUSTRIAL CABLES The present invention refers to the field of industrial automation, with particular reference to industrial robotics and handling in general. In this field, in... |
| 2018/0080970 |
Method and System for Hot Socket Detection in a Utility Meter An arrangement for use in a utility meter comprises a transformer, a voltage source, a sensor, and a processor. The transformer includes a primary winding, a... |
| 2018/0080969 |
APPARATUS AND METHOD FOR IDENTIFYING DEFECTIVE CABLES In some embodiments, an apparatus includes a substrate having a smoothly bending surface to fit into a human hand. The substrate includes a start test switch,... |
| 2018/0080968 |
WIRELESS TERMINAL TESTING SYSTEM Provided is a system for testing a wireless terminal. The wireless terminal is configured as a device under test. The system includes: a test antenna; a... |
| 2018/0080967 |
SYSTEMS AND METHODS FOR DETECTING DEFECTS IN AN ANTENNA ARRAY AND/OR IN A
DEVICE COUPLED TO THE ANTENNA ARRAY Various illustrative embodiments disclosed herein generally pertain to detecting defects by using a radio-frequency debugging signal transmitted by a... |
| 2018/0080966 |
RF ANTENNA SECTOR MONITORING DEVICE AND METHOD System and method for monitoring FCC compliance of a sector having at least one antenna, the sector being at least partially surrounded by a barrier comprising... |
| 2018/0080965 |
GROUP DELAY MEASUREMENT APPARATUS AND METHOD Measurement of group delay for a device under test (DUT). A test signal includes (i) a low frequency sine wave f.sub.LF, (ii) sine wave harmonics at a high... |
| 2018/0080964 |
MEASURING AND ANALYZING DEVICE AS WELL AS METHOD FOR MEASURING AND
ANALYZING SIGNALS A measuring and analyzing device is described which comprises a housing, a spectrum analyzer unit for analyzing a spectrum of a signal received, and a... |
| 2018/0080963 |
CURRENT DETECTION METHOD OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE A control method of a semiconductor device includes inspecting an electrical property of a current detection circuit in the first semiconductor chip, writing... |
| 2018/0080962 |
ELECTRICAL FAULT DETECTION An electrical fault detector is shown for installation in electrical network (101) of the type comprising a first voltage source (104) and a second voltage... |
| 2018/0080961 |
ISOLATED DC CURRENT AND VOLTAGE SENSOR WITH LOW CROSSTALK A magnetic measurement device is provided, including a DC magnetic field sensor consisting of at least four discrete elongate elements, each element consisting... |
| 2018/0080960 |
METHOD FOR DETERMINING THE CURRENT CONSUMPTION OF AN ACTIVE LOAD, FOR
EXAMPLE A PROCESSING UNIT, AND ASSOCIATED... A first resistor and a second resistor are coupled in series between a voltage source and an active load. When the current drawn by the active load exceeds a... |
| 2018/0080959 |
BEAM CURRENT MEASURING DEVICE AND CHARGED PARTICLE BEAM IRRADIATION
APPARATUS A beam current measuring device capable of performing measurement of a beam current distribution of a charged particle beam seamlessly and continuously in an... |
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