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Patent # | Description |
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2018/0226352 |
METHOD TO REDUCE VARIABILITY IN CONTACT RESISTANCE Various methods and semiconductor structures for fabricating at least one FET device having textured gate-source-drain contacts of the FET device that reduce... |
2018/0226351 |
FAN-OUT SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME The present disclosure relates to a fan-out semiconductor package and a method of manufacturing the same. The fan-out semiconductor package includes: a first... |
2018/0226350 |
FAN-OUT SEMICONDUCTOR PACKAGE A fan-out semiconductor package includes: a semiconductor chip having an active surface having connection pads disposed thereon and an inactive surface... |
2018/0226349 |
Multi-Stacked Package-on-Package Structures A multi-stacked package-on-package structure includes a method. The method includes: adhering a first die and a plurality of second dies to a substrate, the... |
2018/0226348 |
SEMICONDUCTOR DEVICE PACKAGE AND METHOD OF MANUFACTURING THE SAME A semiconductor device package includes a flexible substrate, an electronic component, at least one flexible member, and a package body. The electronic... |
2018/0226347 |
Heterojunction Bipolar Transistors With Stress Material For Improved
Mobility According to a semiconductor device herein, the device includes a substrate. An active device is formed in the substrate. The active device includes a... |
2018/0226346 |
THIN FILM ELEMENT AND METHOD FOR MANUFACTURING THE SAME A thin film element that includes a base material, a wiring conductor film disposed on the surface of the base material, a protective film that covers the... |
2018/0226345 |
FUSE STRUCTURE AND METHOD OF MANUFACTURING THE SAME A fuse structure may include an anode pattern, a cathode pattern and a connection member. The anode pattern may be formed on a semiconductor substrate. The... |
2018/0226344 |
FUSE STRUCTURE AND METHOD OF MANUFACTURING THE SAME A fuse structure may include an anode pattern, a cathode pattern and a connection member. The anode pattern may be formed on a semiconductor substrate. The... |
2018/0226343 |
FABRICATION OF VERTICAL FUSES FROM VERTICAL FINS A vertical fuse element, including, a conductive silicide base on a surface of a substrate, and a conductive silicide pillar extending in a direction... |
2018/0226342 |
Bonding Structures and Methods Forming the Same A method includes forming a first dielectric layer over a conductive pad, forming a second dielectric layer over the first dielectric layer, and etching the... |
2018/0226341 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF A semiconductor device according to the present embodiment includes a stacked body having an end which is step-shaped and a contact in each of the steps of the... |
2018/0226340 |
SERIES MIM STRUCTURES The present disclosure relates to an integrated circuit configured to mitigate damage to MIM decoupling capacitors. In some embodiments, the integrated chip... |
2018/0226339 |
THREE PLATE MIM CAPACITOR VIA INTEGRITY VERIFICATION A three plate MIM capacitor structure includes a three plate MIM capacitor, a first wire in a metal layer above/below the three plate MIM, a second wire... |
2018/0226338 |
THREE PLATE MIM CAPACITOR VIA INTEGRITY VERIFICATION A three plate MIM capacitor test structure includes a three plate MIM capacitor, a first test wire in a metal layer above/below the three plate MIM, a second... |
2018/0226337 |
Multiple Metal Layer Semiconductor Device and Low Temperature Stacking
Method of Fabricating the Same A method of fabricating a semiconductor device includes providing a first substrate comprising a first conductive element exposed at a surface of the first... |
2018/0226336 |
INTEGRATED CIRCUIT INCLUDING STANDARD CELL An integrated circuit (IC) may include a plurality of standard cells. At least one standard cell of the plurality of standard cells may include a power rail... |
2018/0226335 |
SEMICONDUCTOR INTEGRATED CIRCUIT A semiconductor integrated circuit includes an output circuit connected between a power supply and a node at which a load can be connected. The output circuit... |
2018/0226334 |
MULTI-DIE PACKAGE Embodiments herein may relate to a package that includes a package substrate with a first die on a first side of the package substrate and a second die on a... |
2018/0226333 |
SEMICONDUCTOR PACKAGE AND METHOD FOR FABRICATING THE SAME A semiconductor package including at least one semiconductor device, a first redistribution layer, a first molding compound, a second molding compound,... |
2018/0226332 |
PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF A package structure includes an interconnection layer; a passivation layer disposed on the interconnection layer, in which the interconnection layer and the... |
2018/0226331 |
GUARD RING DESIGN ENABLING IN-LINE TESTING OF SILICON BRIDGES FOR
SEMICONDUCTOR PACKAGES Guard ring designs enabling in-line testing of silicon bridges for semiconductor packages, and the resulting silicon bridges and semiconductor packages, are... |
2018/0226330 |
ALTERNATIVE SURFACES FOR CONDUCTIVE PAD LAYERS OF SILICON BRIDGES FOR
SEMICONDUCTOR PACKAGES Alternative surfaces for conductive pad layers of silicon bridges for semiconductor packages, and the resulting silicon bridges and semiconductor packages, are... |
2018/0226329 |
METHOD OF FORMING SEMICONDUCTOR STRUCTURE A method of forming a semiconductor device includes forming a first redistribution line on a substrate; forming a plurality of first vertical conductive... |
2018/0226328 |
COAXIAL VIAS Embodiments herein may relate to a substrate that includes a coaxial via with a signal portion and a ground shield portion. In embodiments, the via may further... |
2018/0226327 |
LEAD FRAME AND METHOD FOR MANUFACTURING THE SAME A lead frame constitutes a product unit in a multi-row lead frame and has a dam bar and a lead connected together. The dam bar has a first site where... |
2018/0226326 |
ELECTRO-OPTICAL DEVICE AND ELECTRONIC APPARATUS An electro-optical device includes a first drive IC and a second drive IC which are respectively mounted on a first flexible wiring substrate and a second... |
2018/0226325 |
Integrated Circuit (IC) Package with a Solder Receiving Area and
Associated Methods A single chip integrated circuit (IC) package includes a die pad, and a spacer ring on the die pad defining a solder receiving area. A solder body is on the... |
2018/0226324 |
SEMICONDUCTOR DEVICE AND ELECTRIC POWER CONVERSION DEVICE A semiconductor device includes: a base plate including a metallic base plate and an insulating film provided on the metallic base plate; a semiconductor chip... |
2018/0226323 |
INTEGRATED CIRCUIT HAVING CONTACT JUMPER An integrated circuit includes first and second active regions extending in a first direction, a first gate line extending in a second direction substantially... |
2018/0226322 |
THERMOELECTRIC BONDING FOR INTEGRATED CIRCUITS Techniques for thermal management of an integrated circuit die are provided. In an example, an apparatus can include a first integrated circuit die having a... |
2018/0226321 |
SEMICONDUCTOR STRUCTURE AND ASSOCIATED METHOD FOR MANUFACTURING THE SAME A method for manufacturing a semiconductor structure is disclosed. The method includes: providing a semiconductor substrate having a plurality of dies thereon;... |
2018/0226320 |
SEMICONDUCTOR PACKAGE A semiconductor package includes a substrate, a semiconductor chip and a heat dissipation structure. The semiconductor chip includes a first surface, a second... |
2018/0226319 |
VEHICLE CONTROL DEVICE A vehicle control device (100) includes: a housing (200) made of metal; a substrate (400) housed in the housing (200) and having a mounting surface (401) that... |
2018/0226318 |
POWER ELECTRONICS MODULE A power electronics module and a method of manufacturing a power electronics module and a base plate. The power electronics module comprising at least one... |
2018/0226317 |
NON-PLANAR ELECTROSTATIC DISCHARGE (ESD) PROTECTION DEVICES WITH NANO HEAT
SINKS The present disclosure relates to a thermal management solution for ESD protection devices in advanced Fin- and/or Nanowire-based technology nodes, by... |
2018/0226316 |
Circuit Package A circuit package comprises a circuit device in a first epoxy mold compound and a second epoxy mold compound of different compositions. |
2018/0226315 |
ELECTRONIC SWITCHING ELEMENT AND MODULARLY CONSTRUCTED POWER CONVERTER An electronic switching element includes at least one semiconductor switch inserted into a layer sequence of a conductor structure element; and at least two... |
2018/0226314 |
SEMICONDUCTOR PACKAGE DEVICE AND METHOD OF MANUFACTURING THE SAME A semiconductor package device includes a first substrate, a second substrate and a first spacer. The first substrate includes a first divided pad. The second... |
2018/0226313 |
FORMULATIONS CONTAINING MIXED RESIN SYSTEMS AND THE USE THEREOF FOR
WAFER-LEVEL UNDERFILL FOR 3D TSV PACKAGES Provided herein are mixed resin systems and the use thereof for wafer-level underfill (WAUF) for three-dimensional TSV packages. In one aspect, there are... |
2018/0226312 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF A semiconductor package and a manufacturing method thereof, which can reduce the size of the semiconductor package and improve product reliability. In a... |
2018/0226311 |
SUPPORTING GLASS SUBSTRATE, LAMINATE, SEMICONDUCTOR PACKAGE, ELECTRONIC
DEVICE, AND METHOD OF MANUFACTURING... Devised are a supporting substrate capable of contributing to an increase in density of a semiconductor package and a laminate using the supporting substrate.... |
2018/0226310 |
PACKAGE-INTEGRATED MICROCHANNELS Embodiments of the invention include package substrates that include microchannels and methods of making such package substrates. In an embodiment, the package... |
2018/0226309 |
WAFER LEVEL PACKAGE SOLDER BARRIER USED AS VACUUM GETTER An electronic device and methods of manufacture thereof. One or more methods may include providing a lid wafer having a cavity and a surface surrounding the... |
2018/0226308 |
TIME TEMPERATURE MONITORING SYSTEM A time temperature monitoring system and method for use with a microchip or similar structure. A disclosed system includes: a substrate having an active... |
2018/0226307 |
SYSTEM AND METHOD FOR ELECTRICAL TESTING OF THROUGH SILICON VIAS (TSVs) A substrate includes first and second semiconductor layers doped with opposite conductivity type in contact with each other at a PN junction to form a junction... |
2018/0226306 |
METHOD FOR PECVD OVERLAY IMPROVEMENT The present disclosure generally relates to a method for performing semiconductor device fabrication, and more particularly, to improvements in lithographic... |
2018/0226305 |
SYSTEM AND METHOD FOR MEASUREMENT OF COMPLEX STRUCTURES A system and method of use for simplifying the measurement of various properties of complex semiconductor structures is provided. The system and method... |
2018/0226304 |
System and Method for Measuring Substrate and Film Thickness Distribution The system includes a dual interferometer sub-system configured to measure flatness across a substrate. The system includes a mass sensor configured to measure... |
2018/0226303 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE A method of manufacturing a semiconductor device includes forming transistors in a cell region of a test wafer, forming a first test pattern on a first test... |