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Patent # Description
US-9,817,070 Third tap circuitry controlling linking first and second tap circuitry
IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for...
US-9,817,069 Method and system for construction of a highly efficient and predictable sequential test decompression logic
Systems and methods for a sequential decompressor which builds equations predictably provide a first-in, first out ("FIFO") shift register which is fed by a...
US-9,817,068 Method and system for improving efficiency of sequential test compression using overscan
Systems and methods efficiently bring additional variables into a Pseudo-Random Pattern Generator ("PRPG") in the early cycles of an automatic test pattern...
US-9,817,067 Testbench builder, system, device and method including latency detection
A testbench for testing a device under test (DUT), wherein the testbench has a verification environment including a reference model, a scoreboard and a...
US-9,817,066 Configurable JTAG-to-serial bus translator
A circuit couples a test access port (TAP) having a JTAG interface to another port having a serial interface different from the JTAG interface. The circuit...
US-9,817,065 Test mode circuit and semiconductor device including the same
A test mode circuit of a semiconductor device includes a test mode activating signal generation unit suitable for generating a test mode activating signal in...
US-9,817,064 I/O control circuit for reduced pin count (RPC) device testing
An I/O control circuit includes a plurality of IO cells including an input section for stimulating a plurality of (n) pins of a device under test (DUT) and an...
US-9,817,063 Interconnect reliability structures
The present disclosure relates to semiconductor structures and, more particularly, to interconnect reliability structures and methods of manufacture. The...
US-9,817,062 Parallel concurrent test system and method
A parallel concurrent test (PCT) system is provided for performing the parallel concurrent testing of semiconductor devices. The PCT system includes a pick and...
US-9,817,061 Linear variable differential transformer (LVDT) secondary wiring intermittent failure monitor
Methods and apparatus are provided for detecting sensor wiring faults. A difference is determined between a high voltage and a low voltage. The high voltage and...
US-9,817,060 Optimized wavelength photon emission microscope for VLSI devices
A method for emission testing of a semiconductor device (DUT), by mounting the DUT onto an test bench of an emission tester, the emission tester having an...
US-9,817,059 Evaluation of thermal instability stress testing
A circuit is powered through a transistor whose thermal instability behavior is to be evaluated in a stress test. The transistor is stressed during a stress...
US-9,817,058 Addressable test circuit and test method for key parameters of transistors
An addressable test circuit is configured to test parameters of a plurality of transistors. The addressable test circuit includes combination logic circuits...
US-9,817,057 Electrical device with a pulsed power supply and method for testing the power supply of the electrical device
An electrical device having a clocked circuitry, and a method for testing the power supply unit of the electrical device. The electrical device comprises an...
US-9,817,055 Testing apparatus for testing electrical circuit board having electrical connectors thereon
A testing apparatus for testing a circuit board is disclosed, which includes an upper plate, a lower plate, and an adaptor circuit board. A plurality of...
US-9,817,054 Electrical margining of multi-parameter high-speed interconnect links with multi-sample probing
Methods and apparatus relating to electrical margining of multi-parameter high-speed interconnect links with multi-sample probing are described. In one...
US-9,817,053 Method and apparatus for testing a transformer
For testing a transformer (20) the transformer (20) is emulated by an equivalent circuit (30) and an accuracy of the transformer (20) relative to the equivalent...
US-9,817,052 Method and circuit for determining dispersion of electric power towards ground in electric appliances
An electric appliance (100) is disclosed. The electric appliance has an electric load (205), and a driving element (215) for selectively ...
US-9,817,051 Alternating current loss measuring apparatus
An alternating current loss measuring apparatus for superconductors includes a superconductor specimen, a magnetic field applying coil, a radiation shield, a...
US-9,817,050 Detection of welded contactor using ac coupling
A system for detecting a condition of a contactor configured to connect a battery string to a direct-current bus in a vehicle may include a controller...
US-9,817,049 Device and procedure for the monitoring of a trailer connection box
A device for the monitoring of a trailer connection box of a vehicle to which the electrical system of a trailer can be connected. The device may include a...
US-9,817,048 Image sensor power supply noise detection
A power supply noise measurement circuit includes a multiphase filter coupled to receive a power supply signal. The multiphase filter is coupled to output a...
US-9,817,047 Duty cycle measurement
Methods and systems for measuring a duty cycle of a signal include applying a first branch of an input signal directly to a latch. A delay of a second branch of...
US-9,817,046 System and method for measurement of S-parameters and dispersion and providing a blended solution of both
A system includes a test signal generator generating a test signal having a carrier and at least two sidebands, and provides the test signal to a device under...
US-9,817,045 Methods and system for nonintrusive load monitoring
Identification and tracking of major electric appliances by using aggregate power data obtained at the main breaker level of a residence or commercial...
US-9,817,044 Determination of a substitute value for the primary-side power consumption of a power supply unit
A method of determining a substitute value for a primary-side power consumption of a power supply unit includes recording a first measured value for a...
US-9,817,043 Cassette mounting detection apparatus and method for detecting mounting of a cassette
A cassette mounting detection apparatus may include a cassette mounting unit configured to include a plurality of slots on which a plurality of cassettes is...
US-9,817,042 Fuel dispenser tamper detection arrangement
Methods and systems provide for detecting tampering of a fuel dispenser. Power is applied to a valve coil of a fuel dispenser. The valve coil is part of a...
US-9,817,041 mm-Wave frequency peak detector
A peak detector circuit comprises a first output coupled to ground by a first load and to emitter terminals of first and second switching devices. A second...
US-9,817,040 Measuring method of low off-state current of transistor
A minute current measurement method is provided. In the current measurement method, a first potential is applied to a first terminal of a transistor under test,...
US-9,817,039 Methods for sensing current in a switching regulator
In one embodiment, a current sensing circuit includes a differential current sensing amplifier adapted for sensing a voltage drop across a main transistor, the...
US-9,817,038 Electro-optic current sensor with high dynamic range and accuracy
An optical sensor that senses current by directing polarized light across an airgap that is orthogonal to a direction of current running through a conductor....
US-9,817,037 Electrical current transducer with wound magnetic core
Electrical current transducer including a housing (5), a magnetic field detector device (3) comprising a magnetic field sensing element (11), and a magnetic...
US-9,817,036 High bandwidth current sensor and method therefor
A current sensor comprises a current carrying trace located within a substrate; and a sensing trace located within the substrate proximate to the current...
US-9,817,035 Impedance measuring circuit
An impedance measuring circuit has an amplifier connected to a target and to amplify an input AC voltage with a gain corresponding to an impedance in the target...
US-9,817,034 Measuring device
A measurement device measuring a current passing through a detection resistor coupled between a first node and a second node is provided. An interference...
US-9,817,033 High-voltage measurement divider
A high-voltage measurement divider for an X-ray tube is provided. The high-voltage measurement divider includes a ground connection, a high-voltage connection,...
US-9,817,032 Measurement device
To provide a measurement device which allows long-term accurate measurement of voltage without adversely affecting a device under test, by ensuring a...
US-9,817,031 Magnetically coupled DC current sensor
A method for measuring current includes passing a DC current through the primary side of a transformer and driving the secondary side of the transformer with an...
US-9,817,030 Testing device for testing an under-test object
A testing device includes a base body, a holder, an electrically conductive plate, plural testing probes and plural insulation structures. The testing device of...
US-9,817,029 Test probing structure
A testing probe structure for wafer level testing semiconductor IC packaged devices under test (DUT). The structure includes a substrate, through substrate...
US-9,817,028 Terahertz transmission contactless probing and scanning for signal analysis and fault isolation
An apparatus comprises a contactless sense probe, an electro optic sensor module, and a test signal emitter circuit. The contactless sense probe includes a...
US-9,817,027 Method and device for counting objects
In the field of the counting of objects, a use is provided of a photosensitive assembly comprising at least one photodiode or one photoresistor, and a source of...
US-9,817,026 Wafer level integrated circuit contactor and method of construction
A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are...
US-9,817,025 Waveguides for capturing close-proximity electromagnetic radiation transmitted by wireless chips during testing...
A test fixture has a flexible plastic cable that acts as a waveguide. The Device-Under-Test (DUT) is a small transceiver and antenna that operate in the...
US-9,817,024 Test carrier for mounting and testing an electronic device
A test carrier includes a base member on which a first electronic device under test is able to be temporarily mounted, and a second electronic device which is...
US-9,817,023 Continuous selftest for inertial sensors at 0 Hz
A sensor with continuous self test is provided. An exemplary inertial sensor may include one or more self test electrodes so that one or more test signals may...
US-9,817,022 Method and apparatus for determining vehicle acceleration
Embodiments of the present invention provide a method and an apparatus for determining a vehicle acceleration, which are used to eliminate an interference...
US-9,817,021 Sensor system including two inertial sensors
A sensor system is described as including at least two micromechanical inertial sensors, which are movably connected to a substrate, each inertial sensor...
US-9,817,020 Physical quantity sensor and electronic apparatus
An acceleration sensor includes a base substrate provided with a first recess part, and a sensor part located on the first recess part and swingably supported...
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