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| United States Patent Application |
20040101316
|
| Kind Code
|
A1
|
|
Naoe, Kazuhiko
;   et al.
|
May 27, 2004
|
Semiconductor electro-absorption optical modulator integrated light
emission element, light emission element module and optical transmission
system
Abstract
For achieving a transmission light source having different transmission
properties or characteristics, i.e., the .alpha. parameters, depending
upon application thereof, in a light emission element of semiconductor EA
modulator integrated type being constructed with a light emission portion
for lasing with a single vertical mode and a plurality of EA modulators,
wherein an absorption edge wavelength under the condition of applying no
bias thereto, in the semiconductor multiple-quantum-well structure owned
by the modulator which is near to an emission side of the light emission
portion, is to be equal or longer than the absorption edge wavelength
owned by the modulator positioned far from the emission side of the light
emission portion.
| Inventors: |
Naoe, Kazuhiko; (Yokohama, JP)
; Uomi, Kazuhisa; (Hachioji, JP)
; Aoki, Masahiro; (Kokubunji, JP)
; Fujita, Minoru; (Yokohama, JP)
|
| Correspondence Address:
|
SOFER & HAROUN, LLP
Suite 1921
317 Madison Avenue
New York
NY
10173
US
|
| Assignee: |
Hitachi, Ltd.
OpNext Japan
|
| Serial No.:
|
701505 |
| Series Code:
|
10
|
| Filed:
|
November 5, 2003 |
| Current U.S. Class: |
398/183 |
| Class at Publication: |
398/183 |
| International Class: |
H04B 010/04 |
Foreign Application Data
| Date | Code | Application Number |
| Feb 9, 2000 | JP | P00-038038 |
Claims
What is claimed is:
1. A semiconductor electro-absorption modulator integrated light emission
element, comprising: a light emitting portion having a semiconductor
multiple-quantum-well structure, including a well layer and a barrier
layer in an active layer of light emission region thereof, for lasing a
single in vertical mode; a modulator proton being positioned at a light
emission side of said light emitting portion, and being constructed with
a plurality of electro-absorption optical modulators, each having the
semiconductor multiple-quantum-well structure including the well layer
and the barrier layer therein, and optical separate-confinement-heterostr-
uctures putting said semiconductor multiple-quantum-well structure
including the well layer and the barrier layer therebetween, wherein an
absorption edge wavelength under no biasing condition on the
semiconductor multiple-quantum-well structure, owned by said modulator
which is near to the light emission side of said light emitting portion,
is equal to or longer than the absorption edge wavelength which is owned
by said modulator positioned far from the light emission side of said
light emitting portion.
2. A semiconductor electro-absorption modulator integrated light emission
element, as defined in the claim 1, wherein said plurality of modulators
have respective .alpha. parameter values according to a
fiber-response-peak method, being different to each other.
3. A semiconductor electro-absorption modulator integrated light emission
element, as defined in the claim 2, wherein said semiconductor
multiple-quantum-well structure is strained multiple-quantum-well
structure, and two of said modulators neighboring each other are
different to each other, in the thickness of said well layer and
thickness of the barrier layer.
4. A semiconductor electro-absorption modulator integrated light emission
element, as defined in the claim 2, wherein two of said modulators
neighboring each other are different to each other, in the thickness of
said optical separate-confinement-heterostructures thereof.
5. A semiconductor electro-absorption modulator integrated light emission
element, as defined in the claim 2, wherein two of said modulators
neighboring each other are different to each other, in composition ratio
of said barrier layer in the semiconductor multiple-quantum-well
structure.
6. A semiconductor electro-absorption modulator integrated light emission
element, as defined in the claim 2, wherein two of said modulators
neighboring each other are different to each other, in a number of layers
of said well layer in the semiconductor multiple-quantum-well structure.
7. A semiconductor electro-absorption modulator integrated light emission
element, as defined in the claim 2, wherein two of said modulators
neighboring each other are different to each other, in a density of
p-type doping in a p-type doping layer thereof.
8. A semiconductor electro-absorption modulator integrated light emission
element, as defined in the claim 2, wherein two of said modulators
neighboring each other are different to each other, in EA modulator
length thereof.
9. A light emission element-module, comprising: a carrier chip, on which
is mounted the semiconductor electro-absorption modulator integrated
light emission element being described in the claim 2; a plurality of
signal wirings for electrically connecting between said light emission
element and said chip carrier, for transmitting electric signals
corresponding to the number of said modulators in said modulator portion;
a plurality of input terminals corresponding to the number of said
modulators, being connected to said signal wirings for transmission of
said electrical signals; a lens for condensing a signal light; an
isolator for polarizing said signal light; and an optical fiber for
transmitting said signal light, wherein said lens, isolator and optical
fiber are fixed on an optical axis of a signal light, which is obtained
through electric/p
hoto conversion of said electric signal by said light
emission element, and are air-tightly sealed as a package.
10. A light emission element module, comprising: a carrier chip, on which
is mounted the semiconductor electro-absorption modulator integrated
light emission element being described in the claim 3; a plurality of
signal wirings for electrically connecting between said light emission
element and said chip carrier, for transmitting electric signals
corresponding to the number of said modulators in said modulator portion;
a plurality of input terminals corresponding to the number of said
modulators, being connected to said signal wirings for transmission of
said electrical signals; a lens for condensing a signal light; an
isolator for polarizing said signal light; and an optical fiber for
transmitting said signal light, wherein said lens, isolator and optical
fiber are fixed on an optical axis of a signal light, which is obtained
through electric/p
hoto conversion of said electric signal by said light
emission element, and are air-tightly sealed as a package.
11. An optical transmitter, comprising: a drive circuit portion, being
constructed with a driver circuit for inputting an electric signal to be
transmitted as a signal light, and a change-over switch for changing over
a route of said electric signal with a change-over signal; and an optical
transmitter, being constructed with the light emission element module as
described in the claim 9, wherein any one of said plurality of modulators
is driven by said change-over signal.
12. An optical transmitter, comprising: a drive circuit portion, being
constructed with a driver circuit for inputting an electric signal to be
transmitted as a signal light, and a change-over switch for changing over
a route of said electric signal with a change-over signal; and an optical
transmitter, being constructed with the light emission element module as
described in the claim 10, wherein any one of said plurality of
modulators is driven by said change-over signal.
13. An optical transmission system, comprising: an optical transmitter as
described in the claim 11; an optical switch for inputting a signal light
emitted from said optical transmitter and for changing over to any one of
plural output routes existing, depending upon a change-over signal; a
plurality of optical fibers for inputting an output of said optical
switch, corresponding to said plural output routes; and an optical
receiver for receiving said signal light transmitted on said optical
fiber, wherein the transmission route is changed over depending upon said
change-over signal.
14. An optical transmission system, comprising: an optical transmitter as
described in the claim 12; an optical switch for inputting a signal light
emitted from said optical transmitter and for changing over to any one of
plural output routes existing, depending upon a change-over signal; a
plurality of optical fibers for inputting an output of said optical
switch, corresponding to said plural output routes; and an optical
receiver for receiving said signal light transmitted on said optical
fiber, wherein the transmission route is changed over depending upon said
change-over signal.
15. A light wavelength multiplex optical transmission system, comprising:
a plurality of optical transmitters as described in the claim 13, for
emitting lights, each being different in wavelength; an optical coupler
for multiplexing the signal lights of said plurality of optical
transmitters and for outputting a wavelength multiplex signal light; an
optical switch for inputting the wavelength multiplex signal light and
for changing over to any one of plural output routes existing, depending
upon a change-over signal; a plurality of optical fibers for inputting an
output of said optical switch, corresponding to said plural output
routes; an optical divider for dividing said wavelength multiplex signal
light into the respective signal lights at each wavelength thereof; and
an optical receiver for receiving said signal light transmitted on said
optical fiber, wherein the transmission route is changed over depending
upon said change-over signal.
16. A light wavelength multiplex optical transmission system, comprising:
a plurality of optical transmitters as described in the claim 13, for
emitting lights, each being different in wavelength; an optical coupler
for multiplexing the signal lights of said plurality of optical
transmitters and for outputting a wavelength multiplex signal light; an
optical switch for inputting the wavelength multiplex signal light and
for changing over to any one of plural output routes existing, depending
upon a change-over signal; a plurality of optical fibers for inputting an
output of said optical switch, corresponding to said plural output
routes; an optical divider for dividing said wavelength multiplex signal
light into the respective signal lights at each wavelength thereof; and
an optical receiver for receiving said signal light transmitted on said
optical fiber, wherein the transmission route is changed over depending
upon said change-over signal.
Description
RELATED APPLICATIONS
[0001] This application is a continuation application of allowed U.S.
patent application Ser. No. 09/516,912, filed on Mar. 1, 2000 with the
United States Patent and Trademark Office, the entirety of which is
incorporated herein by reference.
BACKGROUND OF THE INVENTION
[0002] The present invention relates to an electro-absorption (EA)
modulator integrated light source (i.e., a light emission element) having
a plurality of transmission properties or characteristics being different
to each other, and further relates to a light emission element module for
use in an optical transmission and an optical transmitter, and also an
optical transmission system using therein.
[0003] Relevant prior arts will be mentioned in relation with first to
third ones, below.
[0004] Relating to the first relevant art as the light emission element,
by referring to attached FIGS. 1 to 4, the structure of a semiconductor
EA modulator integrated DFB (Distributed Feedback type) laser is
explained, wherein a laser is used in a light emission portion.
[0005] The FIG. 1 shows the semiconductor EA modulator integrated DFB
laser having wavelength of 1.5 .mu.m, for use in an optical transmission
of in transmission speed of 10 Gbit/s and 20 km in distance thereof. In
this figure is shown a cross-section view of a portion of the stripes of
the light emission element, for explaining the structure of the light
emission element. This light emission element is formed, after forming a
mask of oxidization film for a selective growth method on a n-type InP
semiconductor substrate 100, with growing a lower optical
separete-confinement-heterostructure 101 of n-type InGaAsP with the known
selective growth method as a first growth of crystal, a strained
multiple-quantum-well structure 102 composed of an undoped InGaAsP well
layer and eight (8) cycles of barrier layers of undoped InGaAsP having a
composition wavelength 1.15 .mu.m, and an upper optical
separete-confinement-heterostructure 103 of two (2) layers of an undoped
InGaAsP layer and a p-type InGaAsP layer. With using such the method of
the selective growth, in the total thickness thereof, the strained
multiple-quantum-well structure in an EA modulator portion 108 is formed
to be thinner than that in the laser portion 109. Accordingly, an
absorption wavelength of the strained multiple-quantum-well structure in
the EA modulator portion comes to be smaller than that of the laser
portion 109. Further, the semiconductor EA modulator integrated DFB laser
shown in the FIG. 1 is manufactured, by forming a diffraction grating, a
p-type InP clad layer 104, a mesa layer and a re-growth of a Fe--InP
layer 105 for concealing both sides of that mesa layer, and then
electrodes 107. The modulator length, i.e., the length for injecting
current into a wave-guide portion of the EA modulator, is selected to be
157 .mu.m, by taking a capacity of the modulator portion and an
extinction ratio thereof into the consideration for determining a band of
the light emission element, and on a front end surface at the side of EA
modulator is treated an antireflection coating 110, while on a terminal
end surface a reflection coating.
[0006] Further, the FIG. 2 shows a light emission element module being
installed with the above-mentioned light emission element thereon. The
reference numeral 201 shown in the FIG. 2 indicates a chip carrier, on
which the above-mentioned light emission element is mounted, and on which
are formed strip lines for high frequency with a patterning technology or
method, thereby building up a chip capacitor(s) and a terminal
resistor(s), etc., within the light emission element module. Further,
within the present light emission element module are installed or
integrated a thermistor 202, an isolator 203, a lens 205, a high
frequency signal relay substrate 206, a monitor PD install stem 209, and
a cooling stem 208. A reference numeral 207 indicates a high frequency
signal cable for electric signals.
[0007] With this optical element module, the transmission is possible on
an ordinary fiber of 20 km (dispersal value: 400 ps/nm). However, the
transmission is impossible on the fibers other than the ordinary one,
being longer than 20 km, such as the fiber of 40 km (dispersal value: 800
ps/nm).
[0008] The reason of this lies in that the distance of optical
transmission is restricted by chirping. Ordinarily in the transmission on
the optical fiber, two factors, i.e., the chirping and an intensity of
optical output can be mainly considered, of restricting the transmission
distance. The restriction due to the intensity of optical output in the
latter brings about no problem, since it can be amplified to a certain
degree. The main problem here is the restriction due to the chirping in
the former. The chirping means an expanse in the wavelength spectrum of
light emitted from a semiconductor laser modulated. The reason or
mechanism that the chirping restricts the transmission distance is as
follows.
[0009] The chirping is caused by the following two (2) phenomena. First,
during ON/OFF modulating in the light emission element, the chirping
occurs in the wavelength due to changes in the refractive index and the
absorption coefficient inside the light emission element. Second, it is a
phenomenon that the chirping occurs since dispersion is generated when
the light emitting from the light emission element propagates within the
fiber. Accordingly, the larger the distance in the transmission distance
of the fiber, the much more the chirping be caused by the latter.
Further, when occurring the chirping too much, the wave-form of light
signal is distorted to increase a pass penalty, thereby restricting the
transmission distance.
[0010] A ratio, between the changes in refractive index and the absorption
coefficient during the ON/OFF modulation of the light emission element,
is an .alpha. parameter, and that is one of the causes of bringing about
the chirping, and the lower the .alpha., the less the amount of the
chirping during the modulation, then it can be said that the fiber is
endurable against the dispersion. Therefore, the smaller the .alpha.
parameter, the less the ill influence, thereby enabling to extend the
transmission distance without receiving the ill influence from the
dispersion.
[0011] Also, with the .alpha. parameter, there are several methods for
evaluation thereof, such as, one in which a large signal is inputted into
the light emission element to measure it, or other in which a small
signal is inputted to measure it by a fiber-response-peak method, etc.
However, in the present specification, the .alpha. parameter is defined
by an evaluation value in accordance with the fiber-response-peak method,
wherein the small signal is inputted to the light emission element and a
dispersion compensated filer is used (F. Devaux et al., "Simple
Measurement of Fiber Dispersion and Chirp parameter of Intensity
Modulated Light Emitter" J. Lightwave Technol., vol. 11, pp. 1937-1940,
December 1993). Since the .alpha. parameter is defined as a ration a
change amount in refractive index to that in absorption coefficient,
i.e., (change amount in refractive index)/(change amount in absorption
coefficient), it varies following voltage applied to the modulator
portion of the light emission element, depends upon material and MQW
(multiple-Quantum-Well) structure thereof, however the light emission
element comes to have almost it's own value if it is manufactured under a
certain condition of a specification, though there may be brought about a
fluctuation therein a little.
[0012] The dependency (hereinafter, ".alpha. curve(s)") upon voltage
applied to the EA modulator having a typical .alpha. parameter of the
light emission element manufactured with those relevant arts, is shown in
FIG. 3 by a curve (a). in the FIG. 3, the .alpha. parameter depicted by a
curve (a) indicates a value from 0.1 to 1.0, i.e., at applying voltage
around (V.sub.mod-V.sub.mod)/2 when the voltage applied to the EA
modulator is set at the modulation amplitude V.sub.mod of the EA
modulator and the amplitude when it is set at high level V.sub.OH. In
case of this value of the .alpha., according to the evaluation of the
optical fiber with the light emission element module of those related
arts, it is possible to satisfy a standard, which is desired in a pass
penalty when transmitting the light signal through it at a distance of 20
km (dispersal value: 400 ps/nm), for example. However, when conducting
the light transmission at the distance being greater than that of the
ordinary fiber, i.e., 20 km, for example, at the distance 40 km
(dispersal value: 800 ps/nm), the pass penalty exceeds the standard value
thereof, therefore it is difficult to apply it into a practical use
thereof. Accordingly, the EA modulator integrated DFB laser shown in the
relevant arts is only applicable to a system having an optical
transmission system, in which the dispersion in frequency of the light
due to the optical fiber is compensated for every 20 km long, namely, it
can be said to be the EA modulator integrated DFB laser for a version of
20 km.
[0013] An example of the configuration of an optical transmission system
wherein the light emission element module is applied is shown in FIG. 4.
After an optical transmitter apparatus 401 according to the relevant
arts, it is constructed with providing an optical pre-amplifier 402, the
optical fibers 403 of 20 km (dispersal value: 400 ps/nm), dispersion
compensation fibers 404 being provided at ever distance of about 20 km,
an optical post-amplifier 405, and an optical light receiver 406.
[0014] Next, explanation will be given on the structure of the second
relevant art, by referring to the FIGS. 1, 3 and 4.
[0015] This explanation is one for an example, into which is applied the
semiconductor EA modulator integrated DFB laser having a wavelength band
of 1.5 .mu.m, for use in optical transmission at transmission speed 10
Gbit/s and 40 km.
[0016] An aspect, differing from the first relevant art mentioned above,
in particular, in the manufacturing processes or steps thereof, lies in
an active layer portion of the semiconductor which is formed by the
crystal growth method at first time. Explaining this by using the FIG. 1,
the lower n-type InGaAsP optical separete-confinement-heterostructure 101
is laminated at thickness of 58 nm, and then the undoped strained
multiple-quantum-well structure 102 and the undoped upper optical
separete-confinement-heterostructure 103 at the thickness of 60 nm, with
such the selective growth method. In this instance, the
multiple-quantum-well structure is manufactured so that a set of
wavelengths of the barrier layers InGaAsP in the strained
multiple-quantum-well structure 102 is set at 1.3 .mu.m and also the
number of the well-layers is seven (7). Further, the sizes of the light
emission element are so designed that the injection length in the EA
modulator is at 177 .mu.m, although it is at 157 .mu.m in the first
relevant art, but others than those are in the condition same to that of
the first relevant art. Furthermore, a static property or characteristic
and a high frequency property of characteristic, after being installed
into the light emission element module, are almost same to those of the
light emission element module, in which the light emission element of the
first relevant prior art is installed. However, the .alpha. parameter
indicates a value lower that the .alpha. in the light emission element
module of the first relevant art, as shown in the FIG. 3 (b), and the
mark or polarity of the .alpha. is changed over into a negative one when
applying voltage around (V.sub.OH-V.sub.mod)/2 to the EA modulator.
According to the transmission evaluation of optical fiber with the light
emission element module, in which is applied the light emission element
shown in this relevant prior art, differing from that of the first
relevant art, it is possible to satisfy the standard of the desired pass
penalty value when transmitting the light signal through the ordinary
fibers of 40 km (dispersal value: 800 ps/nm). This is because the
chirping is decreased down in the amount thereof due to the low .alpha.,
when conducting ON/OFF modulating on the light emission element, as a
result of this the chirping amount lies within an acceptable region
thereof, even if the transmission distance in the optical fiber(s) is
lengthened or elongated.
[0017] Explanation will be given on the structure or configuration of the
optical transmission system with using an optical transmission apparatus,
in which is installed the present light emission element module, by
referring to the FIG. 4. Assuming that the optical transmission apparatus
according to this relevant art is indicated by a reference numeral 401,
it is constructed by comprising an optical pre-amplifier 402, optical
fibers 403 having a length of 40 km (dispersal value: 800 ps/nm), an
optical post-amplifier 405, and an optical receiver 406. Namely, at the
distance of 40 km, the dispersion compensated fiber 404, being necessary
in the case of the first relevant art, is not necessary here. On a while,
in a case where an optical transmitter according to this relevant art is
applied into the optical transmission system shown in the FIG. 4, into
which the dispersion compensated fibers are inserted, the chirping is
compensated too much because of the insertion of the dispersion
compensated fibers therein. Because of this, an excessive dispersion
occurs, and the pass penalty goes over the standard, therefore it is also
impossible to be applied into practical use. Accordingly, the EA
modulator integrated DFB laser shown in this relevant art is only
applicable to a system having an optical transmission system, in which no
compensation is made on the frequency dispersion of the light up to 40
km, i.e., it can be said to be the EA modulator integrated DFB laser for
a version of 40 km.
[0018] Accordingly, as shown in those first and second relevant arts, the
EA modulator integrated DFB lasers, each having different .alpha.
parameters thereof, are manufactured, and the different systems are
construct therewith. Namely, the EA modulator integrated DFB laser is
used differently, depending upon the dispersal values of the optical
fibers.
[0019] Further, the technology of the third relevant art will be explained
as below.
[0020] The structure of the device, in which two (2) modulators are
constructed in series in the DFB laser, is already known by, for example,
in K. Sato et al., Tech. Digest of ECOC., (1993), WeC7, 2. "A
Multi-section Electroabsorption Modulator Integrated DFB Laser for
Optical Pulse Generation and Modulation". In case of this construction,
the two (2) modulators, i.e., a modulator 1 and a modulator 2, being
formed in series to the DFB laser, are totally same to each other in the
structures of modulator, including, in such as the crystal structure and
the modulator length thereof, and they also have the same .alpha.
parameter therewith. Accordingly, when performing the optical
transmission with this light emission element, the .alpha. parameter has
almost equal value in both cases when the modulator 1 is driven and when
the modulator 2 is driven, therefore the transmission property or
characteristic comes to be the same one. Further, according to the mode
in using the light emission element which is described in this relevant
art, the modulator 1 of the two of them is applied for generating a RF
pulse while the modulator 2 as an encoder. This is the light emission
element for the purpose of using in a so-called time-sharing multiple
optical transmission, as one of the optical transmission methods.
[0021] Therefore, according to the relevant arts mentioned above, the EA
modulator integrated DFB laser must be designed depending upon each
different system, in different optical transmission pass or passage.
[0022] In this manner, the fact that two or more kinds of the light
emission elements and the light emission element modules must be
manufactured for each system (for example, for use in transmission of 20
km, and for use in transmission of 40 km) brings about an important
demerit from a view point of cost reduction that will be required in
coming future. Also, from a view point on the side of using the light
emission element or the light emission element module, the fact that the
light emission element or the light emission element module has no
compatibility between the systems causes a disadvantage in the use
thereof, and it prevents from cost reduction and simplifying or
shortening of the processes therefor.
[0023] For example, in a case when designing an optical transmission
system from a site A in a certain city to a site B in another city, the
dispersion compensated fiber(s) is/are introduced or inserted at an
appropriate position(s), by taking the dispersion in the optical fiber of
the distance between the side A and the side B and the .alpha. parameter
thereof into the consideration, thereby to design the dispersion in the
total transmission pass. However, if assuming that after that an
destination in communication from the site A is changed to a site C in a
new city located between the cities A and B, since the transmission
distance is changed, therefore the dispersal value of the optical fiber
must be changed. In this instance, since the value a of the light source
of the optical transmitter is fixed according to the above relevant arts,
there occurs a necessity that the dispersion compensated fiber(s) is/are
build up at the optical receiver side of the site C of the new city, so
as to adjust the dispersal value in the optical fibers of the optical
transmission system, as a whole.
[0024] Those problems are caused by the facts that each EA modulator
integrated FDB laser has only a certain one .alpha. parameter inherent
and that it is no-changeable nor invariable.
SUMMARY OF THE INVENTION
[0025] An object, according to the present invention, is to provide a
semiconductor electro-absorption optical modulator integrated light
emission element, a light emission element module and an optical
transmission system, wherein plural kinds of optical transmission systems
can be structured by one light emission element, thereby obtaining
simplification or shortening in the design time and in the manufacture
processes thereof, as well as reduction of the cost thereof.
[0026] According to the present invention, for dissolving the
above-mentioned problems, each the modulator integrated light emission
element has a plurality of the .alpha. parameter characteristics.
[0027] Therefore, in a case where the light emission element is
constructed with a first modulator and a second modulator, each having
the respective characteristic, the first modulator 1 is used when
transmitting the light from a cite A to a cite B, and then the second
modulator 2 is used when the destination in communication from the cite A
is changed to a cite C located between the cites A and B. In this manner,
with the provision of only one of the light emission element or the light
emission element module, it is possible to cope with two (2) systems.
BRIEF DESCRIPTION OF THE DRAWING(S)
[0028] FIG. 1 shows a semiconductor EA modulator integrated DFB laser
according to a related art;
[0029] FIG. 2 shows another light emission element module according to the
related art;
[0030] FIG. 3 shows an a curve characteristic in the light emission
element according to the related art;
[0031] FIG. 4 shows the construction of an optical transmission system
according to the related art;
[0032] FIG. 5 shows a layer structure in a semiconductor EA modulator
integrated DFB laser according to the present invention;
[0033] FIG. 6 shows the semiconductor EA modulator integrated DFB laser
according to the present invention;
[0034] FIG. 7 shows a chip carrier in which is installed the semiconductor
EA modulator integrated DFB laser, according to the present invention;
[0035] FIG. 8 shows a light emission element module according to the
present invention;
[0036] FIG. 9 shows an optical transmitter according to the present
invention;
[0037] FIG. 10 shows another optical transmitter according to the present
invention;
[0038] FIG. 11 shows an other optical transmitter according to the present
invention;
[0039] FIGS. 12 (a) and (b) show the structures of optical transmission
systems according to the present invention;
[0040] FIG. 13 shows a view for explaining of manufacturing the light
emission element according to the present invention;
[0041] FIG. 14 also shows a view for explaining of manufacturing the light
emission element according to the present invention;
[0042] FIG. 15 shows the structure of an optical transmission system
according to the present invention; and
[0043] FIG. 16 also shows the structure of an optical transmission system
according to the present invention.
DETAILED DESCRIPTION OF PREFERRED EMBODIMENT(S)
[0044] Hereinafter, explanation will be given on from a first embodiment
to a seventh embodiment.
[0045] A first embodiment of the present invention will be explained by
referring to FIGS. 3 and 5-10. The present embodiment is one which is
applied to a semiconductor EA modulator integrated DFB laser having a
band of wavelength 1.5 .mu.m, for use in optical transmission of 10
Gbit/s.
[0046] The FIG. 5 shows the layer structure of the semiconductor EA
modulator integrated DFB laser, wherein a light emission portion thereof
is applied to a laser portion.
[0047] In comparison with to the semiconductor EA modulator integrated DFB
laser explained in the relevant arts, which is constructed with two
portions, i.e., the laser portion and the EA modulator portion, an EA
modulator integrated light source, as the light emission element
according to the present invention is constructed with three portions, as
shown in the FIG. 5, i.e. a laser portion, an EA modulator 1, and an EA
modulator 3. Accordingly, after forming a mask of an oxidation film for
the selective growth of patterns of the laser portion and the EA
modulators 1 and 2, thereby to form total film thickness of the
respective multiple-quantum-well structures in thick, in that order, and
then are formed, as was mentioned in the relevant art 2, a lower optical
separate-confinement-heterostructure 501 of n-type InGaAsP type, a
strained multiple-quantum-well structure 502 being composed of seven (7)
cycles or repetitions of a well layer of undoped InGaAsP and an undoped
barrier layer of InGaAsP having a composite wavelength 1.3 .mu.m, and an
upper optical separate-confinement-heterostructure 503 of undoped InGaAsP
at thickness of 60 nm, sequentially. In this instance, as shown in the
FIG. 5, the total thickness of the multiple-quantum-well structure is
formed in thick, in an order of the laser portion, the EA modulator 1,
and the EA modulator 2. Accordingly, the absorption wavelength of the
multiple quantum well structure in the EA modulators 1 or the EA
modulator 2 is larger than the absorption wavelength of the laser
portion, and further an absorption edge wavelength of the
multiple-quantum-well structure in the EA modulator 2 is larger than that
in the EA modulator 1, by about 5 nm.
[0048] The absorption edge wavelength of the modulator is defined by an
exciton absorption peak wavelength of the modulator. In this case, the
exciton means a pair of electron and hole existing within the
quantum-well due to the Coulomb force and the quantum-confinement effect,
and an energy of ground state of this exciton corresponds to an exciton
absorption peak energy E. Accordingly, the exciton absorption peak
wavelength .lambda. can be given by .lambda.=hc/E (where, h is the Plank
constant, and c the velocity of light in vacuum).
[0049] Following to the above, in the same manner as in the relevant arts,
forming of a diffraction grating, growing of a clad layer, forming of a
mesa, and growing of an embedded Fe--InP layer are conducted.
[0050] Next, by referring to the FIG. 6, the manufacturing processes or
steps of the EA modulator integrated DFB laser will be explained in
brief, herein after.
[0051] In this instance, differing from the relevant arts, for the purpose
of integrating two of the modulators in front of the DFB laser, the
length of mesa stripes in an optical axis is set to be long, such as 800
.mu.m. Next, between the DFB laser (109) and the modulator 1 (601), and
between the modulator 1 (601) and the modulator 2 (602), isolation
grooves 603 are formed respectively. Also, for the purpose of ensuring
isolation thereof, also ion injection of high resistance, such as proton
or the like, may be conducted between the DFB laser (109) and the
modulator 1 (601), and between the modulator 1 (601) and the modulator 2
(602), respectively, after forming a passivation film thereon.
Continuously, another passivation film is formed, and p-side electrodes
are formed. With the length of modulators, both the EA modulator 1 and
the EA modulator 2 are set at 177 .mu.m, and electrode pads are
positioned on both sides of the EA modulator 1 and the EA modulator 2,
putting a wave guide of mesa type therebetween. Hereinafter, it can be
manufactured in the same manner as in the relevant arts.
[0052] Next, FIG. 7 shows a view of the present light emission element,
being mounted on a chip carrier.
[0053] In the chip carrier 701, two (2) high frequency lines 706 are
positioned while putting a portion therebetween, where the EA modulators
are mounted, so as not to form a directional coupler thereby. After
mounting the EA modulator integrated DFB laser(s) 702 as the present
element and a chip capacitor(s) 704 on the chip carrier 701, wire bonding
is treated with an Au wire, on the laser portion, the EA modulator 1 and
the EA modulator 2, respectively. In this instance, with each of the EA
modulators and the Au wires, there can be considered an anxiety of
cross-talk and/or leakage of high frequency wave, however since the pad
portion of the EA modulators are positioned putting the mesa type wave
guide therebetween, a sufficient distance can be kept between the Au
wires for each, thereby to achieve a design without bringing about such
the problem. Further, the high frequency line EA modulator(s) is
terminated by a thin film resistor 703 at one end thereof, for
suppressing electrical reflection therein.
[0054] Further, FIG. 8 shows the present element being mounted on or put
in the light emission element module. When it is put into the module in
this process, it is also sealed air-tightly, but being omitted to be
shown in the figure. As is shown in the FIG. 8, a high frequency input is
provided each on both sides of the chip carrier, therefore the light
emission element module comes to be same to that of the explanation given
on the first relevant art, except that it is of a dual (2) input type,
wherein the high frequency input terminals are provided at both
(right-hand and left-hand) sides (but, at upper side and lower side in
the FIG. 8).
[0055] An optical output characteristic of the light emission element
module, mounting the present EA modulator integrated DFB laser thereon,
is reduced down by around 3 dB, comparing to that of the light emission
element mounting the EA modulator integrated DFB laser explained in the
relevant arts thereon, since two (2) EA modulators are integrated
therein, however that fact will not bring about a problem in practical
use thereof. Also, the band of high frequency characteristic and the
reflection of electric signals come to be different, a little bit, when
driving the EA modulator 1 or the EA modulator 2, but it is possible to
control them within a level of causing no problem practically. Next, the
characteristic of an extinction ratio and the .alpha. parameter show also
different characteristics when driving the EA modulator 1 or the EA
modulator 2. Explaining this by referring to the FIG. 3, the respective
.alpha. parameters, in the case of driving the EA modulator 1 and the EA
modulator 2, come to be such the characteristics corresponding to the
curves (b) and (a) in the FIG. 3. Accordingly, it is possible to make it
suitable with or fit to the transmission system of 40 km when driving the
EA modulator 1, while being suitable with the transmission system of 20
km when driving the EA modulator 2. Because the two (2) high frequency
inputs are provided in the present light emission element module, it
takes a space a little bit more than when being positioned within an
optical transmitter, however there can be obtain merits that the
cross-talk with high frequency signal and the problem of the directional
coupler hardly occur.
[0056] A block diagram of the light emission element module in the FIG. 8
is shown in FIGS. 9 and 10.
[0057] The optical transmitter in the FIG. 9 is constructed with a
modulator driver 901, a light emission element 902 of the present
invention, and a driver power source 905. The driver power source 905 has
a change-over switch for power supply and also has a function of turning
the bias into 0 V, to the modulator side not to be supplied with the
power. In a case of this optical transmitter, the signal is inputted to
the electric signal input 1 in the figure when the modulator 1 is used,
while it is inputted to the electric signal input 2 in the figure when
the modulator 2 is used, i.e., through change-over of the driver power
source 905, it is possible to show different two (2) kinds of the .alpha.
parameters, namely different two (2) kinds of transmission
characteristics therewith.
[0058] On a while, the optical transmitter in the FIG. 9 is constructed
with the modulator driver 901, the light emission element 902 of the
present invention, a light emission element module 904 according to the
present invention, and a high frequency change-over switch 1001. In this
case, the input of the electric signal is only one (1), therefore it is
possible to change over the high frequency change-over switch 1001
between the modulator 1 and the modulator 2, thereby to show or provide
different two (2) kinds of the .alpha. parameters, namely different two
(2) kinds of transmission characteristics therewith.
[0059] In the explanation on manufacturing of the light emission element
of the present embodiment, active layers of the EA modulator 1 and the EA
modulator 2 are formed, simultaneously, with using the selective area
growth method in a first process of crystal growing. Therefore, it is
easy in the manufacturing process thereof.
[0060] Though the modulator length is set at 177 .mu.m, for example,
however it is possible to obtain the similar effect when changing the
condition, accompanying with the change in a specification about the band
region of the present light emission element and the extinction ratio
when voltage is applied to the modulator, etc.
[0061] Further, though taking the method mentioned above in installation
of the light emission element module, it is also possible to determine
the specification to be same to or fit with the .alpha. curve of either
the modulator 1 or the modulator 2, from the estimation result of the
present element, on a stage of the condition of the light emission
element module, thereby to achieve an instillation being similar to that
of the light emission element according to the relevant arts, wherein
only one of the EA modulator is provided. However, in this case, it is
impossible to select the .alpha. parameter after the installation of the
light emission element module any more.
[0062] Next, another example will be explained as a second embodiment,
hereinafter.
[0063] FIG. 11 shows a view of an optical transmitter installing the light
emission element according to the first embodiment therein, in which the
electrode pads of the two (2) EA modulators are formed in the same
direction upon basis of the mesa type wave guide in the modulator 1 and
the modulator 2, and after being assembled into the light emission
element module. With the light emission element and the manufacture of
the light emission element module, though different in the forming of
electrodes of the light emission element and the position of the high
frequency input portion when assembling the light emission module, since
they are almost similar to those mentioned above, the explanation thereof
is omitted here.
[0064] The optical transmitter shown in the FIG. 11 is constructed with a
modulator driver 1101, a light emission element 1102 on which the
electrode pads are formed in the same direction of the mesa type wave
guide of the light emission element, a light emission element module
1101, a high frequency change-over switch 1103, and a modulator driver
1104. In this case, the input of the signal is only one (1), and the
modulator 1 or the modulator 2 is changed therebetween by change-over of
the high frequency change-over switch 1103, therefore it is possible to
have different two (2) kinds of the .alpha. parameters, namely different
two (2) kinds of transmission characteristics.
[0065] As a further other example will be explained as a third embodiment,
hereinafter.
[0066] With the structure of a transmission path or route 1 shown in the
FIG. 12 (a), after the optical transmitter 1201 according to the present
invention, it is constructed with the optical pre-amplifier 402, the
optical fibers 1202 (dispersal value: 800 ps/nm) of 40 km, the optical
post-amplifier 405, and the optical receiver 406.
[0067] With the structure of a transmission path or route 2 shown in the
FIG. 12 (b), after the optical transmitter 1201 according to the present
invention, it is constructed with the optical pre-amplifier 402, the
optical fibers 403 (dispersal value: 400 ps/nm) of 20 km, the dispersion
compensated fibers 404 provided at every distance of about 20 km, the
optical post-amplifier 405, and the optical receiver 406.
[0068] Accordingly, with applying the present invention therein, it is
possible to select either one of the two (2) kinds of the modulators,
depending upon the system which is different in the transmission distance
thereof. For example, in the case of the transmission path shown in the
FIG. 12 (a), namely, in the optical transmission system of the ordinary
optical fibers being longer than 20 km and up to 40 km (dispersal value:.
800 ps/nm), for example, wherein no dispersion compensation is conducted,
the modulator 1 is used while the EA modulator 2 can be used for the
optical transmission system, in which the frequency dispersion of light
in the fiber is compensated at every distance of 20 km, as in the
transmission path shown in the FIG. 12 (b). Namely, it is possible to
cope with two (2) kinds of systems with only one of the transmitter.
[0069] Further, a fourth embodiment as the other example thereof, will be
explained by referring to the FIGS. 6 and 13.
[0070] In the same manner as in the relevant arts, with the known
selective area growth method are formed a lower optical separate
confinement heterostructure 101 of n-type InGaAsP type, the strained
multiple-quantum-well structure 103, being composed of eight (8) cycles
or repetition of a well layer of undoped InGaAsP and an undoped barrier
layer of InGaAsP having a composite wavelength 1.15 .mu.m, and an upper
optical separate confinement-heterostructure 104 being composed of two
(2) layers of an undoped InGaAsP layer and a P-type InGaAsP layer, and a
p-type InP cap layer 105, sequentially. Following to this, a portion of a
region(s) where the film(s) is/are formed in thin thickness with the
selective growth method is treated by an etching, such as a dry etching
with using SiN film as a mask. Further, after treatment by a wet etching,
in the region where the above-mentioned dry etching is treated, as shown
in the FIG. 13, there are re-grown a lower optical separate confinement
heterostructure 1301 of n-type InGaAsP, a strained multiple-quantum-well
structure 1302 being composed of seven (7) cycles or repetition of a well
layer of undoped InGaAsP and an undoped barrier layer of InGaAsP having a
composite wavelength 1.3 .mu.m, an upper optical separate-confinement-het-
erostructure 1303 of undoped InGaAsP, and a p-type InP cap layer 105,
sequentially, with a butt-joint method. Following to this, after removal
of the SiN layer, the light emission element is manufactured, so that two
(2) sets of the modulators are formed therewith, in the same manner as in
the first embodiment. However, the EA modulator integrated DFB laser
manufactured in this manner comes to be almost similar to that shown in
the FIG. 6, in an outer appearance thereof, therefore the detailed view
of the completed one is omitted to be shown here.
[0071] Between the portion of the modulator 1 and the portion of the
modulator 2, there are differences in the structures of the lower optical
separate-confinement-heterostructure, the multiple-quantum-well
structure, and the upper optical separate-confinement-heterostructure
thereof, therefore, in the same manner as in the first embodiment, the
.alpha. parameter differs when the EA modulator 1 or the EA modulator 2
is driven by each. Further, in addition thereto, the following fact is
also a factor of the difference of the .alpha. parameter. Namely, in the
portion of the modulator 1 and the upper optical separate-confinement-het-
erostructure of the modulator 2, while the upper optical
separate-confinement-heterostructure 104 is formed with the two (2)
layers of the undoped InGaAsP layer and the p-type InGaAsP layer in the
modulator 1, the upper optical separate-confinement-heterostructure 1303
is formed with the undoped InGaAsP layer in the modulator 2. Therefore,
there are differences in profiles of the doping dentistry in the p-type
InP layer, due to the difference in the doping level in the upper optical
separate-confinement-heterostructures and due to an influence of
diffusion of the dopant after the growth of the p-type InP clad layer,
between the modulator 1 and the modulator 2. Also, due to the difference
in the p-type doping density of this p-type doping layer, the .alpha.
parameter characteristics come to have the different values,
respectively.
[0072] Accordingly, with the installation or assembling of the present
light emission element into the light emission element module so as to be
a light source for transmission, either one can be selected from the two
(2) kinds of the .alpha. curve depending upon the system, thereby
obtaining the effects being same to those in the first embodiment.
Further, according to the present embodiment, the butt-joint technology
is utilized in manufacturing the EA modulator 2, therefore can obtain an
advantage that freedom comes to be large in the designing on the
multiple-quantum-well structure of the EA modulator 2, comparing to the
first embodiment.
[0073] The modulator length of the present embodiment is set at 177 .mu.m,
however it is also possible to obtain the same effect(s) by changing the
conditions, accompanying the specifications in the band region of the
light emission element and the extinction ratio when applying voltage to
the modulator, etc.
[0074] Also, in the present embodiment, the composite wavelength of the
barrier layer in the multiple-quantum-well structure, the number of the
quantum-well, and the thickness of the upper optical
separate-confinement-heterostructure are different in the modulator 1 and
the modulator 2, respectively. This is because, since the .alpha.
parameter is defined by (change amount in refractive index)/(change
amount in absorption coefficient), it depends upon the material and the
MQW structure. Accordingly, when designing the .alpha. parameter, it is
also possible to obtain the same effect(s), when designing it by
adjusting the parameters, such as, the composite wavelength of the
barrier layer in the multiple-quantum-well structure, the number of the
quantum-well, the thickness of the upper optical separate-confinement-het-
erostructure layer of InGaAsP, and the doping density of the upper optical
separate-confinement-heterostructure of InGaAsP, etc. Further, in the
present embodiment, the explanation was given on the present embodiment,
assuming that the portion of the modulator 2 is re-grown with the
butt-joint method, however it is also possible to obtain the same
effect(s) by combining with the portion of the modulator 1 and the
portion of the DFB laser, or either one of them. The feature of the
present embodiment lies, different from the first embodiment, in that
those parameters can be adjusted or designed freely when growing crystal
of the portion of the modulator 2 in the manufacturing process of the
light emission element. In this instance, if an absorption edge of an
active layer in the EA modulator 1 is equal to or larger than that in
amount, comparing to the absorption edge of an active layer in the EA
modulator 2, it is needless to say that the same effect(s) can be
obtained, being same to that mentioned in the present embodiment.
[0075] Also, with the light emission element module for use in the optical
transmission, the optical transmitter, and the optical transmission
system, into which the light emission element of the present embodiment
is applied, there can be considered the same ones as shown in the
embodiments 2 and 3, therefore obtaining the same effect(s) therewith.
[0076] Further, a fifth embodiment as the further other example of the
present embodiment, will be explained by referring to FIG. 14.
[0077] The present embodiment is for use in the optical transmission of 10
Gbit/s, and is an embodiment which is applied to a ridge wave-guide type
EA modulator integrated DFB laser of a wavelength band 1.5 .mu.m.
[0078] After forming the selective area growth of the first time, in
accordance with the method being same to that of the first embodiment,
the layers are formed in the order of the laser portion of the
multiple-quantum-well structure, the EA modulator 1, and the EA modulator
2 in thick. Further, according to the processes of the first embodiment,
after forming the diffraction grating, the clad layer is formed.
Following to this, with using the wet etching by means of a water
solution mixing hydrogen bromide and phosphoric acid therein, a mesa-type
optical wave guide 1401 is formed as shown in the FIG. 14, which has a
(111)A surface on a side wall and a reversed mesa cross-section shape.
Thereafter, the light emission element is manufactured by the ordinary
processes of the ridge wave guide type laser.
[0079] The EA modulator integrated DFB laser of the present embodiment
also has, in the same manner to the first embodiment, the modulator 1 and
the modulator 2, therefore it can be said that the same effect(s) can be
obtaining therewith. Further, the structure of the ridge wave-guide type,
which is explained in the present embodiment, includes no such the buried
growth of the Fe--InP therein, in comparison with the first embodiment
and the second embodiment, therefore achieving an effect that the light
emission element can be manufactured easily.
[0080] In the present embodiment, the selective growth technology is
utilized for changing the total thickness of the multiple-quantum-well
structures in the laser portion, and the EA modulator 1 and the EA
modulator 2. However, as was explained in relation with the fourth
embodiment, it is needless to say that the manufacture of the light
emission element achieving the same is also possible in a cases where the
light emission element is manufactured with changing the total thickness
of the multiple-quantum-well structures in the laser portion, and the EA
modulator 1 and the EA modulator 2, by combining the selective growth
method and the butt-joint method.
[0081] Also, with the light emission element module for use in the optical
transmission, the optical transmitter, and the optical transmission
system, into which the light emission element of the present embodiment
is applied, there can be considered the same structure as shown in the
embodiments 2 and 3, therefore obtaining the same effect(s).
[0082] Further, a sixth embodiment as the further other example of the
present embodiment, will be explained by referring to FIG. 15.
[0083] The present embodiment is the EA modulator integrated DFB laser for
use in the optical transmission of 10 Gbit/s, and is also an embodiment
of an optical transmission system, into which is applied the light
emission element being integrated with n pieces (n.gtoreq.2) of EA
modulators in series. In the first embodiment, the fourth embodiment and
the fifth embodiment, there are described the method for manufacturing
the elements, in which two (2) pieces of the EA modulators are integrated
with, however also the integration of n pieces of the EA modulators is
possible in the same manner, by the selective growth method and the
butt-joint method. Also, for determining the value n, considerations must
be paid to an optical output power of the laser and the cross-talk of
high frequency signal when installing or assembling the light emission
element module.
[0084] An example of the optical transmission system is shown in FIG. 15,
in particular, in a case where the optical transmitter is manufactured
with using the light emission element, in which the n piece of the EA
modulators are integrated in series.
[0085] The FIG. 15 shows the optical transmission system, being
constructed with the light emitter 1501 installing the light emission
element, in which the n piece of the EA modulators are integrated in
series, an 1:n optical switch 1502, the optical fiber(s) 403 and an
optical receiver 606. In this case, since the distances from the optical
transmitter to the optical receiver are different, respectively,
therefore due to the restriction from the chirping, there occurs a
necessity that the optical signal must be transmitted by a transmitter
source having the .alpha. parameter being different depending upon the
distances. With using the optical transmitter, according to the present
invention, in which is installed the light emission element integrating
the n piece of the EA modulators therein, being different in the .alpha.
parameters thereof, it is possible to transmit data to desired positions
being different in the distances, by changing over the EA modulators to
be used, depending upon the distance from the optical transmitter to the
optical receiver in connection with the optical switch 1502 of 1:n. As a
manner of change-over of the EA modulators, there can be considered one
wherein, for example, the receiving portions from 1 to n1 are assigned
for driving the EA modulator 1, while the other portion from n2 to n3 are
for driving the EA modulator 2, etc.
[0086] In the conventional manner, the data is converted into the optical
signal to be transferred after distributing it into n pieces of the
transmission paths by means of electric signals, therefore there are
necessitated n pieces of the optical transmitters for converting the
electric signals into the optical signals corresponding to the respective
optical distances. However, with using the present invention, it is
possible to construct the system wherein the signal from one of the
optical transmitter is distributed by the optical switch so to perform
communications at the different transmission distances. In the case of
this system, it is enough with only one of the optical transmitter to
manage, thereby bringing about large merits on the cost reduction and/or
on the designing thereof, since the system construction can be simplified
therewith.
[0087] Further, a seventh embodiment, as the further other example of the
present embodiment, will be explained by referring to FIG. 16.
[0088] The present embodiment is an embodiment wherein the light emission
element is applied into an optical path network, in which the n pieces
(n.gtoreq.2) of the EA modulators are integrated in series in the EA
modulator integrated DFB laser, for use in the optical transmission of 10
Gbit/s.
[0089] The FIG. 16 shows an optical transmission system, being constructed
with the light emitter 1501 installing the light emission element, in
which the n piece of the EA modulators are integrated in series, a 1:1
optical switch 1601, the optical fiber(s) 403, and an optical receiver
606. In this case, since the distances from the optical transmitter to
the optical receiver are different, respectively, therefore due to the
restriction from the chirping, there also occurs the necessity that the
optical signal must be transmitted by a transmitter source having the
.alpha. parameters being different depending upon the distances. With
using the optical transmitter according to the present invention, i.e.,
installing the light emission element, in which the n piece of the EA
modulators are integrated, being different in the .alpha. parameters
thereof, it is possible to transmit data to the desired positions being
different in the distances, by changing over the EA modulators to be
used, depending upon the distance from the optical transmitter to the
optical receiver, in connection with the optical switch 16502. As a
manner of changing over the EA modulators is, there can be considered one
wherein, for example, the receiving portions from 1 to n1 are assigned
for driving the EA modulator 1, while the other portion from n2 to n3 are
for driving the EA modulator 2, thereby being applicable or usable in the
optical path networks having wide transmission distances therewith.
[0090] According to the present invention, the EA modulator integrated
light source having two transmission properties or characteristics being
different to each other can be achieved by only one piece of the light
emission element, and further it is also possible to cope with the two
(2) different optical transmission systems by means of the only one light
emission element module or optical transmitter, into which the light
emission element of the present invention is applied or installed.
Further, since it is possible to cope with the systems more than two (2)
by means of the properties or characteristics of the only one light
emission element, therefore it brings bout an important merit on the cost
reduction in manufacturing of the light emission elements. Also with
regard the light emission element module and the optical transmitter,
there is no need to divide them for each of the systems, thereby
achieving low cost and easiness in adjustment of the system, and also in
designing of the optical transmission circuit.
* * * * *