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United States Patent	D311,346
Gross	October 16, 1990

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The ornamental design for electronic test probe, as shown and described.

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Inventors:	Gross; Robert F. (Andover, MA)
Assignee:	Q.A. Technology Company (Exeter, NH)
Appl. No.:	07/101,169
Filed:	September 25, 1987

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Current U.S. Class:	D10/80
Field of Search:	D10/75-80 324/158P

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References Cited

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U.S. Patent Documents

4397519	August 1983	Cooney
4461993	July 1984	Glau
4597622	July 1986	Coe
4659987	April 1987	Coe et al.

Foreign Patent Documents

	3103077		Aug., 1982		DE

Primary Examiner: Dunkins; Bruce W.
Assistant Examiner: Davis; Antoine D.
Attorney, Agent or Firm: Davis, Bujold & Streck

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Description

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FIG. 1 is a front perspective view of a electronic test probe showing my new design;

FIG. 2 is a rear elevational view, taken along line 2--2 of FIG. 1; and

FIG. 3 is a front end elevational view thereof, taken along line 3--3 of FIG. 3.

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